Search Results - "Huang, Chiao-Ti" :: K.UTB vyhledávací portál

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Implant Isolation of Silicon Two-Dimensional Electron Gases at 4.2 K

by Chiao-Ti Huang, Jiun-Yun Li, Sturm, J. C.
Published in IEEE electron device letters (01.01.2013)

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Journal Article

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Pyro-paraelectricity

by Chin, Huai-An, Mao, Sheng, Huang, Chiao-Ti, Ohemeng, Kwaku K., Wagner, Sigurd, Purohit, Prashant K., McAlpine, Michael C.
Published in Extreme Mechanics Letters (01.03.2015)

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Journal Article

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Very Low Electron Density in Undoped Enhancement-Mode Si/SiGe Two-Dimensional Electron Gases with Thin SiGe Cap Layers

by Huang, Chiao-Ti, Li, Jiun-Yun, Sturm, James C.
Published in ECS transactions (03.05.2013)

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Journal Article

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Extremely Sharp Phosphorus Turn-Off Slope and Effect of Hydrogen on Phosphorus Surface Segregation in Epitaxially-Grown Relaxed Si0.7Ge0.3 by RTCVD

by Jiun-Yun Li, Chiao-Ti Huang, Sturm, J. C.
Published in 2012 International Silicon-Germanium Technology and Device Meeting (ISTDM) (01.06.2012)

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Conference Proceeding

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High Breakdown Voltage Schottky Gating of Doped Si/SiGe 2DEG Systems Enabled by Suppression of Phosphorus Surface Segregation

by Chiao-Ti Huang, Jiun-Yun Li, Sturm, J. C.
Published in 2012 International Silicon-Germanium Technology and Device Meeting (ISTDM) (01.06.2012)

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Conference Proceeding

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Extremely Low Electron Density in a Modulation-Doped Si/SiGe Two-Dimensional Electron Gases by Effective Schottky Gating

by Li, Jiun-Yun, Huang, Chiao-Ti, Rokhinson, Leonoid P., Sturm, James C.
Published in ECS transactions (15.03.2013)

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Journal Article

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BURIED LOW-K DIELECTRIC TO PROTECT SOURCE/DRAIN TO GATE CONNECTION

by Huang, Chiao-Ti, Greene, Brian, Lin, Chung-Hsun, Matsubayashi, Akitomo
Year of Publication 03.10.2024

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Patent

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BURIED LOW-K DIELECTRIC TO PROTECT SOURCE/DRAIN TO GATE CONNECTION

by Huang, Chiao-Ti, Greene, Brian, Lin, Chung-Hsun, Matsubayashi, Akitomo
Year of Publication 02.10.2024

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Patent

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Comparison of Lateral Non-uniformity Phenomena between HfO 2 and SiO 2 from Magnified C-V Curves in Inversion Region

by Cheng, Jen-Yuan, Huang, Chiao-Ti, Lu, Hui-Ting, Hwu, Jenn-Gwo
Published in ECS transactions (25.09.2009)

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Journal Article

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TRANSISTORS HAVING INCREASED EFFECTIVE CHANNEL WIDTH

by Huang, Chiao-Ti, Zheng, Yuanwei, Hu, Sing-Chung, Phan, Bill
Year of Publication 29.06.2023

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Patent

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MODULATION OF CHIP PERFORMANCE BY CONTROLLING TRANSISTOR GATE PROFILE

by Tan, Jeffrey Miles, Ghostine, Ramy, Huang, Chiao-Ti, Ghosh, Swapnadip, Prince, Matthew, Bowonder, Anupama, Bayati, Reza
Year of Publication 03.10.2024

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Patent