The fibrosis‐4 score is associated with long‐term mortality in different phenotypes of acute heart failure
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Published in European journal of clinical investigation (01.12.2022)
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Neuroprotective Effects of Intranasal IGF-1 against Neonatal Lipopolysaccharide-Induced Neurobehavioral Deficits and Neuronal Inflammation in the Substantia Nigra and Locus Coeruleus of Juvenile Rats
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Published in Developmental neuroscience (01.01.2017)
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Influence of Oxygen Concentration on Resistance Switching Characteristics of Gallium Oxide
Jheng-Jie Huang, Ting-Chang Chang, Jyun-Bao Yang, Shih-Ching Chen, Po-Chun Yang, Yu-Ting Chen, Hsueh-Chih Tseng, Sze, S. M., Ann-Kuo Chu, Ming-Jinn Tsai
Published in IEEE electron device letters (01.10.2012)
Published in IEEE electron device letters (01.10.2012)
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Influence of forming process on resistance switching characteristics of In2O3/SiO2 bi-layer
Huang, Jheng-Jie, Chang, Ting-Chang, Yang, Po-Chun, Chen, Yu-Ting, Tseng, Hsueh-Chih, Yang, Jyun-Bao, Sze, Simon M., Chu, Ann-Kuo, Tsai, Ming-Jinn
Published in Thin solid films (15.01.2013)
Published in Thin solid films (15.01.2013)
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Tissue inhibitor of metalloproteinase (TIMP)-1 predicts failure of recovery of ejection fraction in acute heart failure with reduced ejection fraction
Tseng, Chih-Hsueh, Huang, Wei-Ming, Chang, Hao-Chih, Yu, Wen-Chung, Cheng, Hao-Min, Chiang, Chern-En, Chen, Chen-Huan, Sung, Shih-Hsien
Published in Open heart (25.09.2024)
Published in Open heart (25.09.2024)
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Resistive switching characteristics of gallium oxide for nonvolatile memory application
Yang, Jyun-Bao, Chang, Ting-Chang, Huang, Jheng-Jie, Chen, Shih-Ching, Yang, Po-Chun, Chen, Yu-Ting, Tseng, Hsueh-Chih, Sze, Simon M., Chu, Ann-Kuo, Tsai, Ming-Jinn
Published in Thin solid films (01.02.2013)
Published in Thin solid films (01.02.2013)
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Influence of Oxygen Concentration on Self-Compliance RRAM in Indium Oxide Film
Yang, Jyun-Bao, Bao, Ding-Hua, Chang, Ting-Chang, Huang, Jheng-Jie, Chen, Yu-Ting, Tseng, Hsueh-Chih, Chu, Ann-Kuo, Sze, Simon M., Tsai, Ming-Jinn, Zheng, Jin-Cheng
Published in IEEE electron device letters (01.09.2014)
Published in IEEE electron device letters (01.09.2014)
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Improvement of Resistive Switching Characteristics by Thermally Assisted Forming Process for SiO2-Based Structure
CHEN, Yu-Ting, CHANG, Ting-Chang, SZE, Simon M, YANG, Po-Chun, HUANG, Jheng-Jie, TSENG, Hsueh-Chih, HUANG, Hui-Chun, YANG, Jyun-Bao, CHU, Ann-Kuo, GAN, Der-Shin, TSAI, Ming-Jinn
Published in IEEE electron device letters (01.02.2013)
Published in IEEE electron device letters (01.02.2013)
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Impact of Electroforming Current on Self-Compliance Resistive Switching in an ITO/Gd:SiOx/TiN Structure
TSENG, Hsueh-Chih, CHANG, Ting-Chang, WANG, Ying-Lang, CHU, Ann-Kuo, WU, Yi-Chun, WU, Sei-Wei, HUANG, Jheng-Jie, CHEN, Yu-Ting, YANG, Jyun-Bao, LIN, Tzu-Ping, SZE, Simon M, TSAI, Ming-Jinn
Published in IEEE electron device letters (01.07.2013)
Published in IEEE electron device letters (01.07.2013)
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Role of InGaOx resistive switching characteristics on the performances of resistance random access memory of Pt/IGO/TiN device
Yang, Jyun-Bao, Chang, Ting-Chang, Huang, Jheng-Jie, Chen, Yu-Ting, Yang, Po-Chun, Tseng, Hsueh-Chih, Chu, Ann-Kuo, Sze, Simon M., Tsai, Ming-Jinn
Published in Thin solid films (15.01.2013)
Published in Thin solid films (15.01.2013)
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Resistive switching characteristics of ytterbium oxide thin film for nonvolatile memory application
Tseng, Hsueh-Chih, Chang, Ting-Chang, Huang, Jheng-Jie, Chen, Yu-Ting, Yang, Po-Chun, Huang, Hui-Chun, Gan, Der-Shin, Ho, New-Jin, Sze, Simon M., Tsai, Ming-Jinn
Published in Thin solid films (30.12.2011)
Published in Thin solid films (30.12.2011)
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Investigating bipolar resistive switching characteristics in filament type and interface type BON-based resistive switching memory
Tseng, Hsueh-Chih, Chang, Ting-Chang, Cheng, Kai-Hung, Huang, Jheng-Jie, Chen, Yu-Ting, Jian, Fu-Yen, Sze, Simon M., Tsai, Ming-Jinn, Chu, Ann-Kuo, Wang, Ying-Lang
Published in Thin solid films (01.02.2013)
Published in Thin solid films (01.02.2013)
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Improvement of Resistive Switching Characteristics by Thermally Assisted Forming Process for \hbox-Based Structure
Yu-Ting Chen, Ting-Chang Chang, Po-Chun Yang, Jheng-Jie Huang, Hsueh-Chih Tseng, Hui-Chun Huang, Jyun-Bao Yang, Ann-Kuo Chu, Der-Shin Gan, Ming-Jinn Tsai, Sze, Simon M.
Published in IEEE electron device letters (01.02.2013)
Published in IEEE electron device letters (01.02.2013)
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Impact of Electroforming Current on Self-Compliance Resistive Switching in an /SiO}/ Structure
Tseng, Hsueh-Chih, Chang, Ting-Chang, Wu, Yi-Chun, Wu, Sei-Wei, Huang, Jheng-Jie, Chen, Yu-Ting, Yang, Jyun-Bao, Lin, Tzu-Ping, Sze, Simon. M., Tsai, Ming-Jinn, Wang, Ying-Lang, Chu, Ann-Kuo
Published in IEEE electron device letters (01.07.2013)
Published in IEEE electron device letters (01.07.2013)
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Thermal Impact on the Activation of Resistive Switch in Silicon Oxide Based RRAM
Chen, Yu-Ting, Chang, Ting-Chang, Huang, Jheng-Jie, Tseng, Hsueh-Chih, Yang, Po-Chun, Chu, Ann-Kuo, Yang, Jyun-Bao, Tsai, Ming-Jinn, Wang, Ying-Lang, Sze, Simon M.
Published in ECS solid state letters (22.08.2012)
Published in ECS solid state letters (22.08.2012)
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