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Year of Publication 24.04.2024
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Year of Publication 24.04.2024
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METHOD FOR OBTAINING THE EQUIVALENT OXIDE THICKNESS OF A DIELECTRIC LAYER
WU, YI-SHAN, LIN, CHIAO-JUNG, CHANG, MAO-NAN, LIU, CHI-LUN, CHOU, HSUEH-LIANG, HSUEH, YU-HSUN
Year of Publication 11.07.2024
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Year of Publication 11.07.2024
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METHOD FOR OBTAINING THE EQUIVALENT OXIDE THICKNESS OF A DIELECTRIC LAYER
WU, YI-SHAN, LIN, CHIAO-JUNG, CHANG, MAO-NAN, LIU, CHI-LUN, CHOU, HSUEH-LIANG, HSUEH, YU-HSUN
Year of Publication 25.04.2024
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Year of Publication 25.04.2024
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Method for obtaining the equivalent oxide thickness of a dielectric layer
WU, YI-SHAN, LIN, CHIAO-JUNG, CHANG, MAO-NAN, LIU, CHI-LUN, CHOU, HSUEH-LIANG, HSUEH, YU-HSUN
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Year of Publication 01.05.2024
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TWI832501B
WU, YI-SHAN, LIN, CHIAO-JUNG, CHANG, MAO-NAN, LIU, CHI-LUN, CHOU, HSUEH-LIANG, HSUEH, YU-HSUN
Year of Publication 11.02.2024
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Year of Publication 11.02.2024
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METHOD FOR OBTAINING THE EQUIVALENT OXIDE THICKNESS OF A DIELECTRIC LAYER
HSUEH YU HSUN, CHOU HSUEH LIANG, CHANG MAO NAN, LIU CHI LUN, WU YI SHAN, LIN CHIAO JUNG
Year of Publication 29.04.2024
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Year of Publication 29.04.2024
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