by Kuo, Yen-Ting, Lin, Wei-Chen, Chen, Chun, Hsieh, Chao-Ho, Li, James Chien-Mo, Jia-Wei Fang, Eric, Hsueh, Sung S.-Y.
Published in 2021 IEEE International Test Conference (ITC) (01.10.2021)

by Su, Min-Yan, Lin, Wei-Chen, Kuo, Yen-Ting, Li, Chien-Mo, Fang, Eric Jia-Wei, Hsueh, Sung S.-Y.
Published in 2021 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) (19.04.2021)

by Varma, Anshul, Gururajarao, Sumanth, Chen, HsinChen, Chen, Tao, Gammie, Gordon, Mair, Hugh, Yang, Jen-Hang, Yu, Hao-Hsiang, Chang, Shun-Chieh, Yang, Cheng-Hao, Huang, Li-An, Ramanathan, Kumar, Halli, Ramesh, Ho, Efron, Hung, Ta-Wen, Hsueh, Sung S.-Y., Li, LiangChe, Thippana, Achuta, Wang, Ericbill, Hwang, Sa
Published in 2024 IEEE International Solid-State Circuits Conference (ISSCC) (18.02.2024)

by Huang, Bo-Jr, Tsai, Alfred, Hsieh, Lear, Chang, Kathleen, Tsai, C.-J., Chen, Jia-Ming, Fang, Eric Jia-Wei, Hsueh, Sung S.-Y., Ciao, Jack, Chen, Barry, Chang, Chuck, Kao, Ping, Wang, Ericbill, Chen, Harry H., Mair, Hugh, Hwang, Shih-Arn
Published in 2023 IEEE International Solid- State Circuits Conference (ISSCC) (19.02.2023)

by Huang, Bo-Jr, Fang, Eric Jia-Wei, Hsueh, Sung S.-Y., Huang, Rory, Lin, Angus, Chiang, Chi-Hsun, Lin, Yi-Hsuan, Hsieh, Wen-Wen, Chen, Barry, Zhuang, Yi-Chang, Wu, Cheng-Yuh, Chen, Jia-Ming, Chen, YS, Wan, Cheng-Tien, Wang, Ericbill, Chiou, Alex, Kao, Ping, Tsai, Yuwen, Chen, Harry H., Hwang, Shih-Arn
Published in 2021 IEEE International Solid- State Circuits Conference (ISSCC) (13.02.2021)

by Lin, Wei-Chen, Chen, Chun, Hsieh, Chao-Ho, Li, James Chien-Mo, Fang, Eric Jia-Wei, Hsueh, Sung S.-Y.
Published in 2022 IEEE International Test Conference (ITC) (01.09.2022)

by Hsueh, Sung S.-Y, Huang, Ryan H.-M, Wen, Charles H.-P
Published in Fifteenth International Symposium on Quality Electronic Design (01.03.2014)