Ranking the environmental factors of indoor air quality of metropolitan independent coffee shops by Random Forests model
Lin, Yu-Wen, Tang, Chin-Sheng, Liu, Hsi-Chen, Lee, Tzu-Ying, Huang, Hsiao-Yun, Hsu, Tzu-An, Chang, Li-Te
Published in Scientific reports (26.09.2022)
Published in Scientific reports (26.09.2022)
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Journal Article
Survivable and Reliable WDM-PON System With Self-Protected Mechanism Against Fiber Fault
Yeh, Chien-Hung, Luo, Chien-Ming, Xie, Yue-Ru, Chow, Chi-Wai, Chen, Yu-Wen, Hsu, Tzu-An
Published in IEEE access (2019)
Published in IEEE access (2019)
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Journal Article
Adaptive and secure VCSEL FSO based on simple dual-polarized architecture for short distance transmission
Yeh, Chien-Hung, Yang, Yun-Cheng, Hsu, Tzu-An, Chen, Yu-Wen, Chow, Chi-Wai, Chen, Jing-Heng
Published in Physica scripta (01.09.2020)
Published in Physica scripta (01.09.2020)
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Journal Article
Phase I first-in-human trial of ABT-301, an oral pan-HDAC inhibitor, in patients with advanced solid tumors
Lin, Chia-Chi, Chen, Tom Wei-Wu, Shiah, Her-Shyong, Tan, Kien Thiam, Lin, Chien-Ting, Hsu, Tzu-An, Lin, Meng-Chieh, Liou, Jing-Ping, Pan, Shiow-Lin, Huang, Han-Li, Sung, Ting-Yi, Lai, Mei-Jung, Chen, Chun-Han
Published in Journal of clinical oncology (01.06.2023)
Published in Journal of clinical oncology (01.06.2023)
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Journal Article
Understanding barrier engineered charge-trapping NAND flash devices with and without high-K dielectric
Hang-Ting Lue, Sheng-Chih Lai, Tzu-Hsuan Hsu, Pei-Ying Du, Szu-Yu Wang, Kuang-Yeu Hsieh, Liu, R., Chih-Yuan Lu
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
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Conference Proceeding
Study of localized tunnel oxide degradation after hot carrier stressing using a novel mid-bandgap voltage characterization method
Cheng-Hung Tsai, Yen-Hao Shih, Yi-Hsuan Hsiao, Tzu-Hsuan Hsu, Kuang Yeu Hsieh, Liu, R., Chih-Yuan Lu
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
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Conference Proceeding
A Novel Channel-Program-Erase Technique with Substrate Transient Hot Carrier Injection for SONOS Memory Application
Tzu-Hsuan Hsu, Jau-Yi Wu, Ya Chin King, Hang Ting Lue, Yen Hao Shih, Erh-Kun Lai, Kuang-Yeu Hsieh, Rich Liu, Chih-Yuan Lu
Published in 2006 European Solid-State Device Research Conference (01.09.2006)
Published in 2006 European Solid-State Device Research Conference (01.09.2006)
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Conference Proceeding
A High-Speed BE-SONOS NAND Flash Utilizing the Field-Enhancement Effect of FinFET
Tzu-Hsuan Hsu, Hang-Ting Lue, Erh-Kun Lai, Jung-Yu Hsieh, Szu-Yu Wang, Ling-Wu Yang, Ya-Chin King, Yang, T., Kuang-Chao Chen, Kuang-Yeu Hsieh, Rich Liu, Chih-Yuan Lu
Published in 2007 IEEE International Electron Devices Meeting (01.12.2007)
Published in 2007 IEEE International Electron Devices Meeting (01.12.2007)
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Conference Proceeding
Study of Local Trapping and STI Edge Effects on Charge-Trapping NAND Flash
Hang-Ting Lue, Tzu-Hsuan Hsu, Szu-Yu Wang, Yi-Hsuan Hsiao, Erh-Kun Lai, Ling-Wu Yang, Tahone Yang, Kuang-Chao Chen, Kuang-Yeu Hsieh, Rich Liu, Chih-Yuan Lu
Published in 2007 IEEE International Electron Devices Meeting (01.12.2007)
Published in 2007 IEEE International Electron Devices Meeting (01.12.2007)
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Conference Proceeding
A critical review of charge-trapping NAND flash devices
Hang-Ting Lue, Sheng-Chih Lai, Tzu-Hsuan Hsu, Yi-Hsuan Hsiao, Pei-Ying Du, Szu-Yu Wang, Kuang-Yeu Hsieh, Liu, R., Chih-Yuan Lu
Published in 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (01.10.2008)
Published in 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (01.10.2008)
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Conference Proceeding
Reliability of planar and FinFET SONOS devices for NAND flash applications - Field enhancement vs. barrier engineering
Tzu-Hsuan Hsu, Hang-Ting Lue, Sheng-Chih Lai, Ya-Chin King, Kuang-Yeu Hsieh, Rich Liu, Chih-Yuan Lu
Published in 2009 International Symposium on VLSI Technology, Systems, and Applications (01.04.2009)
Published in 2009 International Symposium on VLSI Technology, Systems, and Applications (01.04.2009)
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Conference Proceeding
A NAND-type Flash Memory Using Impact Ionization Generated Substrate Hot Electron Programming (≫20MB/sec) and Hot Hole Erasing
Wu, Jau-Yi, Kuo, Ming-Chang, Hsu, Tzu-Hsuan, Chen, Kuan-Fu, Chen, Yin-Jen, Lai, Erh-Kun, Lee, Ming-Hsiu, Hsieh, Kuang-Yeu, Liu, Rich, Lu, Chih-Yuan
Published in 2007 IEEE International Electron Devices Meeting (01.12.2007)
Published in 2007 IEEE International Electron Devices Meeting (01.12.2007)
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Conference Proceeding
A High Performance and Scalable FinFET BE-SONOS Device for NAND Flash Memory Application
Tzu-Hsuan Hsu, Hang-Ting Lue, Wu-Chin Peng, Ya-Chin King, Chia-Wei Wu, Szu-Yu Wang, Ming-Tsung Wu, Shih-Ping Hong, Jung-Yu Hsieh, Tahone Yang, Kuang-Chao Chen, Kuang-Yeu Hsieh, Liu, R., Chih-Yuan Lu
Published in 2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) (01.04.2008)
Published in 2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) (01.04.2008)
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Conference Proceeding