by Chiang, Hsiu-Yin, Huang, Han-Chun, Chung, Chih-Wei, Yeh, Yi-Chun, Chen, Yi-Chin, Tien, Ni, Lin, Hsiu-Shan, Ho, Mao-Wang, Kuo, Chin-Chi
Published in Antimicrobial resistance & infection control (12.11.2019)

by Sun, Jerry Chih-Yuan, Lin, Hsiu-Shan
Published in Computers and education (01.04.2022)

by Weng, Ching-Yun, Ho, Cheng-Mao, Dou, Horng-Yunn, Ho, Mao-Wang, Lin, Hsiu-Shan, Chang, Hui-Lan, Li, Jing-Yi, Lin, Tsai-Hsiu, Tien, Ni, Lu, Jang-Jih
Published in Journal of microbiology, immunology and infection (01.02.2013)

by Pan, Tung-Ming, Lin, Hsiu-Shan, Chen, Main-Gwo, Liu, Chuan-Hsi, Chang, Yih-Jau
Published in IEEE electron device letters (01.07.2002)

by Chiang, Hsiu-Yin, Huang, Han-Chun, Chung, Chih-Wei, Yeh, Yi-Chun, Tien, Ni, Lin, Hsiu-Shan, Kuo, Chin-Chi
Published in Open forum infectious diseases (26.11.2018)

by LIU, Chuan H, LIN, Hsiu-Shan, LEE, J. H, HUANG, M, HSIUNG, Chiung-Sheng, HUANG-LU, S, HSU, Chen-Chung, LIANG, Alan Y, JENKON CHEN, HSIEH, W. Y, YEN, P. W, CHIEN, S. C, LIN, Yu-Yin, LOH, Y. T, CHANG, Yih J, LIOU, Fu-Tai, CHEN, M. G, PAN, T. M, KAO, C. J, HUANG, K. T, LIN, S. H, SHENG, Y. C, CHANGE, Wen-Tung
Year of Publication 2002

by Yao-Ting, Sung, Yeh-Tai Chou, Pei-Yu, Wu, Lin, Hsiu-Shan, Feng-Lan, Tseng
Published in Jiao yu ke xue yan jiu qi kan (01.06.2010)

by Pan, Tung-Ming, Lin, Hsiu-Shan, Chen, Main-Gwo, Liu, Chuan-Hsi, Chang, Yih-Jau
Published in IEEE electron device letters (01.07.2002)

by Tung-Ming Pan, Hsiu-Shan Lin, Main-Gwo Chen, Chuan-Hsi Liu, Yih-Jau Chang
Published in IEEE electron device letters (01.07.2002)

by 宋曜廷Yao-Ting Sung, 周業太 Yeh-Tai Cho, 吳佩璵 Pei-Yu Wu, 林秀珊 Hsiu-Shan Lin, 曾芬蘭 Feng-Lan Tseng
Published in Jiao yu ke xue yan jiu qi kan (01.06.2010)

by Pan, Tung-Ming, Lin, Hsiu-Shan, Chen, Main-Gwo, Liu, Chuan-Hsi, Chang, Yih-Jau
Published in IEEE electron device letters (01.01.2002)

by 宋曜廷, 周業太, 吳佩璵, 林秀珊, 曾芬蘭
Published in Jiao yu ke xue yan jiu qi kan (01.06.2010)

by Liu, Chuan-Hsi, Lin, Hsiu-Shan, Lin, Yu-Yin, Pan, Tung-Ming, Huang, Kuo-Tai
Year of Publication 29.04.2003

by PAN TUNG-MING, LIN YU-YIN, LIN HSIU-SHAN, LIU CHUAN-HSI, HUANG KUO-TAI
Year of Publication 29.04.2003

by LIN, YU-YIN, PAN, TUNG-MING, LIU, CHUAN-HSI, LIN, HSIU-SHAN, HUANG, KUO-TAI
Year of Publication 01.11.2002

by Liu, C.H., Hsiu-Shan Lin, Yu-Yin Lin, Chen, M.G., Pan, T.M., Kao, C.J., Huang, K.T., Lin, S.H., Sheng, Y.C., Wen-Tung Chang, Lee, J.H., Huang, M., Chiung-Sheng Hsiung, Huang-Lu, S., Chen-Chung Hsu, Liang, A.Y., Jenkon Chen, Hsieh, W.Y., Yen, P.W., Chien, S.C., Loh, Y.T., Chang, Y.J., Fu-Tai Liou
Published in 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) (2002)