Durability and stability test of proton exchange membrane fuel cells prepared from polybenzimidazole/poly(tetrafluoro ethylene) composite membrane
Lin, H.L., Hsieh, Y.S., Chiu, C.W., Yu, T.L., Chen, L.C.
Published in Journal of power sources (01.08.2009)
Published in Journal of power sources (01.08.2009)
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Conference Proceeding
Protective Effects of Berberine against Low-Density Lipoprotein (LDL) Oxidation and Oxidized LDL-Induced Cytotoxicity on Endothelial Cells
Hsieh, Yih-Shou, Kuo, Wu-Hsien, Lin, Ta-Wei, Chang, Horng-Rong, Lin, Teseng-His, Chen, Pei-Ni, Chu, Shu-Chen
Published in Journal of agricultural and food chemistry (12.12.2007)
Published in Journal of agricultural and food chemistry (12.12.2007)
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The dry process of ZnO film deposition by atmospheric pressure plasma
Ting, K, Kao, J Y, Hsieh, Y S, Chen, C C, Chang, C C, Wu, C J
Published in Journal of physics. Conference series (01.01.2013)
Published in Journal of physics. Conference series (01.01.2013)
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Journal Article
Optimizing Floating Body Effect & AC performance in 65nm PD-SOI CMOS
Huang, R.M., Chen, T.F., Hong, S.F., Lin, Y.H., Tsai, T.L., Liu, E.C., Yang, C.W., Hsieh, Y.S., Huang, Y.T., Pelloie, J.-L., Tsai, C.T., Ma, G.H.
Published in 2007 IEEE International SOI Conference (01.10.2007)
Published in 2007 IEEE International SOI Conference (01.10.2007)
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Conference Proceeding
Thermogravimetric Studies on the Global Kinetics of Carbon Gasification in Nitrous Oxide
Teng, Hsisheng, Lin, Hung-Chi, Hsieh, Ya-Sheng
Published in Industrial & engineering chemistry research (01.03.1997)
Published in Industrial & engineering chemistry research (01.03.1997)
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Journal Article
Symmetrical 45nm PMOS on [110] substrate with excellent S/D extension distribution and mobility enhancement
Hwang, J.R., Ho, J.H., Liu, Y.C., Shen, J.J., Chen, W.J., Chen, D.F., Liao, W.S., Hsieh, Y.S., Lin, W.M., Hsu, C.H., Lin, H.S., Lu, M.F., Kuo, A., Huang-Lu, S., Tang, H., Chen, D., Shiau, W.T., Liao, K.Y., Sun, S.W.
Published in Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004 (2004)
Published in Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004 (2004)
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The observation of trapping and detrapping effects in high-k gate dielectric MOSFETs by a new gate current Random Telegraph Noise (IG-RTN) approach
Chang, C.M., Chung, S.S., Hsieh, Y.S., Cheng, L.W., Tsai, C.T., Ma, G.H., Chien, S.C., Sun, S.W.
Published in 2008 IEEE International Electron Devices Meeting (01.12.2008)
Published in 2008 IEEE International Electron Devices Meeting (01.12.2008)
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Channel soft breakdown enhanced excess low-frequency noise in ultra-thin gate oxide PD analog SOI devices [MOSFETs]
Chiang, S., Chen, M.C., Liao, W.S., You, J.W., Lu, M.F., Hsieh, Y.S., Lin, W.M., Huang-Lu, S., Shiau, W.T., Chien, S.C., Tahui Wang
Published in 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual (2005)
Published in 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual (2005)
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Conference Proceeding
Thermal budget optimization on Strained Silicon-On-Insulator (SSOI) CMOS
Huang, R.M., Lin, Y.H., Tsai, S.H., Yang, C.W., Liu, E.C., Hsieh, Y.S., Cayrefourcq, I., Tsai, C.T., Ma, G.H.
Published in 2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) (01.04.2008)
Published in 2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) (01.04.2008)
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Conference Proceeding
Reliability of ALD Hf-based High K Gate Stacks with Optimized Interfacial Layer and Pocket Implant Engineering
Mao, A.Y., Lin, W.M., Yang, C.W., Hsieh, Y.S., Cheng, L.W., Lee, G.D., Tsai, C.T., Chung, S.S., Ma, G.H.
Published in 2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) (01.04.2007)
Published in 2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) (01.04.2007)
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Conference Proceeding
Twin-GD: A New Twin Gated-Diode Measurement for the Interface Characterization of Ultra-Thin Gate Oxide MOSFET's with EOT Down to 1nm
Lee, G.D., Chung, S.S., Mao, A.Y., Lin, W.M., Yang, C.W., Hsieh, Y.S., Chu, K.T., Cheng, L.W., Tai, H., Hsu, L.T., Lee, C.R., Meng, H.L., Tsai, C.T., Ma, G.H., Chien, S.C., Sun, S.W.
Published in 2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2006)
Published in 2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2006)
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