Imaging of soft and hard materials using a Boersch phase plate in a transmission electron microscope
Alloyeau, D., Hsieh, W.K., Anderson, E.H., Hilken, L., Benner, G., Meng, X., Chen, F.R., Kisielowski, C.
Published in Ultramicroscopy (01.04.2010)
Published in Ultramicroscopy (01.04.2010)
Get full text
Journal Article