VE-FIDES: Designing Trustworthy Supply Chains Using Innovative Fingerprinting Implementations
Lippmann, Bernhard, Hatsch, Joel, Seidl, Stefan, Houdeau, Detlef, Subrahmanyam, Niranjana Papagudi, Schneider, Daniel, Safieh, Malek, Passarelli, Anne, Maftun, Aliza, Brunner, Michaela, Music, Tim, Pehl, Michael, Siddiqui, Tauseef, Brederlow, Ralf, Schlichtmann, Ulf, Driemeyer, Bjoern, Ortmanns, Maurits, Hesselbarth, Robert, Hiller, Matthias
Published in 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.04.2023)
Published in 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.04.2023)
Get full text
Conference Proceeding
Towards a Comprehensive System for Physical Hardware Inspection for Trust
Lippmann, Bernhard, Ludwig, Matthias, Houdeau, Detlef, Kovac, Nicola, Gieser, Horst
Published in 2023 IEEE Physical Assurance and Inspection of Electronics (PAINE) (24.10.2023)
Published in 2023 IEEE Physical Assurance and Inspection of Electronics (PAINE) (24.10.2023)
Get full text
Conference Proceeding
SUBSTRATE FOR A SEMICONDUCTOR CHIP
HUBER, MICHAEL, STAMPKA, PETER, HOUDEAU, DETLEF, SCHEUENPFLUG, RICHARD, ROHDE, VOLKER
Year of Publication 25.02.2000
Get full text
Year of Publication 25.02.2000
Patent
METHOD FOR MANUFACTURING A CARRIER ELEMENT FOR SEMICONDUCTOR CHIPS
HUBER, MICHAEL, STAMPKA, PETER, GRAF, HELMUT, HEITZER, JOSEF, HOUDEAU, DETLEF, FISCHER, JORGEN
Year of Publication 25.03.2000
Get full text
Year of Publication 25.03.2000
Patent