Predicting Vt mean and variance from parallel Id measurement with model-fitting technique
Chih-Ying Tsai, Kao-Chi Lee, Chien-Hsueh Lin, Sung-Chu Yu, Wen-Rong Liau, Hou, Alex Chun-Liang, Ying-Yen Chen, Chun-Yi Kuo, Jih-Nung Lee, Chao, Mango C.-T
Published in 2016 IEEE 34th VLSI Test Symposium (VTS) (01.04.2016)
Published in 2016 IEEE 34th VLSI Test Symposium (VTS) (01.04.2016)
Get full text
Conference Proceeding
Journal Article
A Model-Based-Random-Forest Framework for Predicting V Mean and Variance Based on Parallel I Measurement
Lin, Chien-Hsueh, Tsai, Chih-Ying, Lee, Kao-Chi, Yu, Sung-Chu, Liau, Wen-Rong, Hou, Alex Chun-Liang, Chen, Ying-Yen, Kuo, Chun-Yi, Lee, Jih-Nung, Chao, Mango C.-T.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.10.2018)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.10.2018)
Get full text
Journal Article
A Model-Based-Random-Forest Framework for Predicting [Formula Omitted] Mean and Variance Based on Parallel [Formula Omitted] Measurement
Chien-Hsueh, Lin, Chih-Ying Tsai, Kao-Chi, Lee, Sung-Chu, Yu, Wen-Rong Liau, Alex Chun-Liang Hou, Ying-Yen, Chen, Chun-Yi, Kuo, Lee, Jih-Nung, Chao, Mango C-T
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.01.2018)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.01.2018)
Get full text
Journal Article