Commercialization and reliability of 600 V GaN power switches
Kikkawa, Toshihide, Hosoda, Tsutomu, Shono, Ken, Imanishi, Kenji, Asai, Yoshimori, YiFeng Wu, Likun Shen, Smith, Kurt, Dunn, Dixie, Chowdhury, Saurabh, Smith, Peter, Gritters, John, McCarthy, Lee, Barr, Ronald, Lal, Rakesh, Mishra, Umesh, Parikh, Primit
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
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Conference Proceeding
Relationship Between the Depth of Understanding of the “Internists Specialized for Organ/Region” About the Characteristics of the “General Practitioner” And Recognition of the Need for Clinical Training at Home Medical Care Setting Before Changing Their Career Direction
Kimura, Takuma, Nomura, Kyoko, Kawagoe, Shohei, Waza, Kazuhiro, Hosoda, Tsutomu, Niimori, Kanako, Imanaga, Mitsuhiko
Published in Journal of Japanese Association for Home Care Medicine (2020)
Published in Journal of Japanese Association for Home Care Medicine (2020)
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Journal Article
Short-Circuit Capability with GaN HEMTs : Invited
Bisi, Davide, Cruse, Bill, Zuk, Philip, Parikh, Primit, Mishra, Umesh, Hosoda, Tsutomu, Kamiyama, Masamichi, Kanamura, Masahito
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
Short-Circuit Capability Demonstrated for GaN Power Switches
Bisi, Davide, Gritters, John, Hosoda, Tsutomu, Kamiyama, Masamichi, Cruse, Bill, Huang, YuLu, McKay, Jim, Gupta, Geetak, Lal, Rakesh, Neufeld, Carl, Zuk, Philip, Wu, YiFeng, Parikh, Primit, Mishra, Umesh
Published in 2021 IEEE Applied Power Electronics Conference and Exposition (APEC) (14.06.2021)
Published in 2021 IEEE Applied Power Electronics Conference and Exposition (APEC) (14.06.2021)
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Conference Proceeding
Short-Circuit Protection for GaN Power Devices with Integrated Current Limiter and Commercial Gate Driver
Bisi, Davide, Nguyen, Long, Zuk, Philip, Gokhale, Ashish, Coffey, Keith, Liu, Ted, Cruse, Bill, Hosoda, Tsutomu, Kamiyama, Masamichi, Parikh, Primit, Mishra, Umesh
Published in 2022 IEEE Applied Power Electronics Conference and Exposition (APEC) (20.03.2022)
Published in 2022 IEEE Applied Power Electronics Conference and Exposition (APEC) (20.03.2022)
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Conference Proceeding
600 V JEDEC-qualified highly reliable GaN HEMTs on Si substrates
Kikkawa, Toshihide, Hosoda, Tsutomu, Imanishi, Kenji, Shono, Ken, Itabashi, Kazuo, Ogino, Tsutomu, Miyazaki, Yasumori, Mochizuki, Akitoshi, Kiuchi, Kenji, Kanamura, Masahito, Kamiyama, Masamichi, Akiyama, Shiniichi, Kawasaki, Susumu, Maeda, Takeshi, Asai, Yoshimori, YiFeng Wu, Smith, Kurt, Gritters, John, Smith, Peter, Chowdhury, Saurabh, Dunn, Dixie, Aguilera, Martin, Swenson, Brian, Birkhahn, Ron, McCarthy, Lee, Likun Shen, McKay, Jim, Clement, Heber, Honea, Jim, Sung Yea, Thor, Douglas, Lal, Rakesh, Mishra, Umesh, Parikh, Primit
Published in 2014 IEEE International Electron Devices Meeting (01.12.2014)
Published in 2014 IEEE International Electron Devices Meeting (01.12.2014)
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Conference Proceeding
5000+ Wafers of 650 V Highly Reliable GaN HEMTs on Si Substrates: Wafer Breakage and Backside Contamination Results
Chowdhury, Saurabh, Wu, YiFeng, Shen, Likun, McCarthy, Lee, Parikh, Primit, Rhodes, David, Hosoda, Tsutomu, Kotani, Yoshiyuki, Imanishi, Kenji, Asai, Yoshimori, Ogino, Tsutsumo, Kiuchi, Kenji
Published in 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.08.2020)
Published in 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.08.2020)
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Conference Proceeding
650 V Highly Reliable GaN HEMTs on Si Substrates over multiple generations: Expanding usage of a mature 150 mm Si Foundry
Chowdhury, Saurabh, Wu, YiFeng, Shen, Likun, Smith, Peter, Gritters, John, McCarthy, Lee, Barr, Ronald, Parikh, Primit, Hosoda, Tsutomu, Kotani, Yoshiyuki, Imanishi, Kenji, Ogino, Tsutsumo, Kiuchi, Kenji, Asai, Yoshimori
Published in 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2019)
Published in 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2019)
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Conference Proceeding
600 V GaN HEMT on 6-inch Si substrate using Au-free Si-LSI process for power applications
Kikkawa, Toshihide, Hosoda, Tsutomu, Akiyama, Shinichi, Kotani, Yoshiyuki, Wakabayashi, Toshihiro, Ogino, Tsutomu, Imanishi, Kenji, Mochizuki, Akitoshi, Itabashi, Kazuo, Shono, Ken, Asai, Yoshimori, Joshin, Kazukiyo, Ohki, Toshihiro, Kanamura, Masahito, Nishimori, Masato, Imada, Tadahiro, Kotani, Junji, Yamada, Atsushi, Nakamura, Norikazu, Hirose, Tatsuya, Watanabe, Keiji
Published in The 1st IEEE Workshop on Wide Bandgap Power Devices and Applications (01.10.2013)
Published in The 1st IEEE Workshop on Wide Bandgap Power Devices and Applications (01.10.2013)
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Conference Proceeding
Dynamic performances of GaN-HEMT on Si in cascode configuration
Hirose, Tatsuya, Imai, Miki, Joshin, Kazukiyo, Watanabe, Keiji, Ogino, Tsutomu, Miyazaki, Yasumori, Shono, Ken, Hosoda, Tsutomu, Asai, Yoshimori
Published in 2014 IEEE Applied Power Electronics Conference and Exposition - APEC 2014 (01.03.2014)
Published in 2014 IEEE Applied Power Electronics Conference and Exposition - APEC 2014 (01.03.2014)
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Conference Proceeding
650 V Highly Reliable GaN HEMTs on Si Substrates over Multiple Generations: Matching Silicon CMOS Manufacturing Metrics and Process Control
Chowdhury, Saurabh, Wu, YiFeng, Shen, Likun, Smith, Kurt, Smith, Peter, Kikkawa, Toshihide, Gritters, John, McCarthy, Lee, Lal, Rakesh, Barr, Ronald, Wang, Zhan, Mishra, Umesh, Parikh, Primit, Hosoda, Tsutomu, Shono, Ken, Imanishi, Kenji, Ogino, Tsutsumo, Mochizuki, Akitoshi, Kiuchi, Kenji, Asai, Yoshimori
Published in 2016 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS) (01.10.2016)
Published in 2016 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS) (01.10.2016)
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Conference Proceeding