A Long-term View of Research Targets in Nanoelectronics
Cavin, R. K., Zhirnov, V. V., Bourianoff, G. I., Hutchby, J. A., Herr, D. J. C., Hosack, H. H., Joyner, W. H., Wooldridge, T. A.
Published in Journal of nanoparticle research : an interdisciplinary forum for nanoscale science and technology (01.12.2005)
Published in Journal of nanoparticle research : an interdisciplinary forum for nanoscale science and technology (01.12.2005)
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Journal Article
Recent advances in process synthesis for semiconductor devices
Hosack, H.H., Mozumder, P.K., Pollack, G.P.
Published in IEEE transactions on electron devices (01.03.1998)
Published in IEEE transactions on electron devices (01.03.1998)
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Journal Article
Effect of particles on buried oxide defects in SIMOX material
Joyner, K., El-Ghor, M., Hosack, H.
Published in 1991 IEEE International SOI Conference Proceedings (1991)
Published in 1991 IEEE International SOI Conference Proceedings (1991)
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Conference Proceeding
An in-process evaluation technique for detection of buried oxide leakage on SOI materials
Joyner, K., Aton, T., Hosack, H.
Published in 1991 IEEE International SOI Conference Proceedings (1991)
Published in 1991 IEEE International SOI Conference Proceedings (1991)
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Conference Proceeding
International Statistical Metrology Workshop
HOSACK, Harold H, MASUDA, Hiroo
Published in IEEE transactions on semiconductor manufacturing (1998)
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Published in IEEE transactions on semiconductor manufacturing (1998)
Conference Proceeding
Particle Effects on Buried Oxide Leakage in Simox Materials
Hosack, H.H., Joyner, K.A., El-Ghor, M.K., Hollingsworth, J., Brown, G.A., Pollack, G.P.
Published in 1992 IEEE International SOI Conference (1992)
Published in 1992 IEEE International SOI Conference (1992)
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Conference Proceeding
A 640 Megapixel/sec 512 × 512 interline transfer virtual phase CCD
Wadsworth, M., Hosack, H., Freeman, J., Hovland, L.
Published in 1986 International Electron Devices Meeting (1986)
Published in 1986 International Electron Devices Meeting (1986)
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Conference Proceeding