Effectiveness of SEL Hardening Strategies and the Latchup Domino Effect
Dodds, N. A., Hooten, N. C., Reed, R. A., Schrimpf, R. D., Warner, J. H., Roche, N. J., McMorrow, D., Wen, S., Wong, R., Salzman, J. F., Jordan, S., Pellish, J. A., Marshall, C. J., Gaspard, N. J., Bennett, W. G., Zhang, E. X., Bhuva, B. L.
Published in IEEE transactions on nuclear science (01.12.2012)
Published in IEEE transactions on nuclear science (01.12.2012)
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Journal Article
Differential Charge Cancellation (DCC) Layout as an RHBD Technique for Bulk CMOS Differential Circuit Design
Blaine, R. W., Atkinson, N. M., Kauppila, J. S., Armstrong, S. E., Hooten, N. C., Warner, J. H., Holman, W. T., Massengill, L. W.
Published in IEEE transactions on nuclear science (01.12.2012)
Published in IEEE transactions on nuclear science (01.12.2012)
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Journal Article
Efficient Method for Estimating the Characteristics of Radiation-Induced Current Transients
Bennett, W. G., Schrimpf, R. D., Hooten, N. C., Reed, R. A., Kauppila, J. S., Weller, R. A., Warren, K. M., Mendenhall, M. H.
Published in IEEE transactions on nuclear science (01.12.2012)
Published in IEEE transactions on nuclear science (01.12.2012)
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Journal Article
The Significance of High-Level Carrier Generation Conditions for Charge Collection in Irradiated Devices
Hooten, N. C., Edmonds, L. D., Bennett, W. G., Ahlbin, J. R., Dodds, N. A., Reed, R. A., Schrimpf, R. D., Weller, R. A.
Published in IEEE transactions on nuclear science (01.12.2012)
Published in IEEE transactions on nuclear science (01.12.2012)
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Journal Article
Single Particle Displacement Damage in Silicon
Auden, E. C., Weller, R. A., Mendenhall, M. H., Reed, R. A., Schrimpf, R. D., Hooten, N. C., King, M. P.
Published in IEEE transactions on nuclear science (01.12.2012)
Published in IEEE transactions on nuclear science (01.12.2012)
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Journal Article
Validation of the Variable Depth Bragg Peak Method for Single-Event Latchup Testing Using Ion Beam Characterization
Roche, N. J.-H, Buchner, S. P., Foster, C. C., King, M. P., Dodds, N. A., Warner, J. H., McMorrow, D., Decker, T., OaNeill, P. M., Reddell, B. D., Nguyen, K. V., Samsel, I. K., Hooten, N. C., Bennett, W. G., Reed, R. A.
Published in IEEE transactions on nuclear science (01.12.2014)
Published in IEEE transactions on nuclear science (01.12.2014)
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Journal Article
SEL-Sensitive Area Mapping and the Effects of Reflection and Diffraction From Metal Lines on Laser SEE Testing
Dodds, N. A., Hooten, N. C., Reed, R. A., Schrimpf, R. D., Warner, J. H., Roche, N. J.-H, McMorrow, D., Buchner, S., Jordan, S., Pellish, J. A., Bennett, W. G., Gaspard, N. J., King, M. P.
Published in IEEE transactions on nuclear science (01.08.2013)
Published in IEEE transactions on nuclear science (01.08.2013)
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Journal Article
Effects of Stopping Ions and LET Fluctuations on Soft Error Rate Prediction
Weeden-Wright, S. L., King, Michael Patrick, Hooten, N. C., Bennett, W. G., Sierawski, B. D., Schrimpf, R. D., Weller, R. A., Reed, R. A., Mendenhall, M. H., Fleetwood, D. M., Alles, M. L., Baumann, R. C.
Published in IEEE transactions on nuclear science (01.02.2015)
Published in IEEE transactions on nuclear science (01.02.2015)
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Journal Article
RHBD Technique for Single-Event Charge Cancellation in Folded-Cascode Amplifiers
Atkinson, N. M., Blaine, R. W., Kauppila, J. S., Armstrong, S. E., Loveless, T. Daniel, Hooten, N. C., Holman, W. T., Massengill, L. W., Warner, J. H.
Published in IEEE transactions on nuclear science (01.08.2013)
Published in IEEE transactions on nuclear science (01.08.2013)
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Journal Article
The Effect of High-Z Materials on Proton-Induced Charge Collection
Clemens, M A, Hooten, N C, Ramachandran, V, Dodds, N A, Weller, R A, Mendenhall, M H, Reed, R A, Dodd, P E, Shaneyfelt, M R, Schwank, J R, Blackmore, E W
Published in IEEE transactions on nuclear science (01.12.2010)
Published in IEEE transactions on nuclear science (01.12.2010)
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Journal Article
Alpha-Particle and Focused-Ion-Beam-Induced Single-Event Transient Measurements in a Bulk 65-nm CMOS Technology
Gadlage, M J, Ahlbin, J R, Bhuva, B L, Hooten, N C, Dodds, N A, Reed, R A, Massengill, L W, Schrimpf, R D, Vizkelethy, G
Published in IEEE transactions on nuclear science (01.06.2011)
Published in IEEE transactions on nuclear science (01.06.2011)
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Journal Article
Identification of pulse quenching enhanced layouts with subbandgap laser-induced single-event effects
Ahlbin, J. R., Hooten, N. C., Gadlage, M. J., Warner, J. H., Buchner, S. P., McMorrow, D., Massengill, L. W.
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)
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Conference Proceeding
Soft errors and NBTI in SiGe pMOS transistors
Fleetwood, D. M., Zhang, E. X., Duan, G. X., Zhang, C. X., Samsel, I. K., Hooten, N. C., Bennett, W. G., Schrimpf, R. D., Reed, R. A., Linten, D., Mitard, J.
Published in 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2014)
Published in 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2014)
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Conference Proceeding