Design and characterization of a high-precision resistor ladder test structure
Tuinhout, H.P., Hoogzaad, G., Vertregt, M., Roovers, R.L.J., Erdmann, C.
Published in IEEE transactions on semiconductor manufacturing (01.05.2003)
Published in IEEE transactions on semiconductor manufacturing (01.05.2003)
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Journal Article
Conference Proceeding
Surge protection circuit
Pansier, Frans, Hoogzaad, Gian, Schmid, Markus, Kuebrich, Johann Baptist Daniel, Laro, Peter, Duerbaum, Thomas Antonius
Year of Publication 28.03.2018
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Year of Publication 28.03.2018
Patent