by Hong, Sung Joo, Hihara, Eiji, Dang, Chaobin
Published in Journal of membrane science (15.10.2018)

by Park, Sung-Kun, Lee, Tae-Ho, Kwon, Young-Jun, Park, Chang-Su, Cho, In-Wook, Hong, Sung-Joo, Oh, Hoon-Sang, Yoo, Kyung-Dong, Joo, Young-Dong, Lee, Jun-Ho, Kim, Seung-Deok
Published in IEEE transactions on electron devices (01.04.2021)

by Hong, Sung Joo, Hihara, Eiji, Dang, Chaobin
Published in Journal of membrane science (15.06.2019)

by Lee, Ju‐Young, Gil, Young‐Chun, Shin, Kang‐Jae, Kim, Jeong‐Nam, Joo, Sung‐Hong, Koh, Ki‐Seok, Song, Wu‐Chul
Published in Anatomical record (Hoboken, N.J. : 2007) (01.03.2016)

by KIM, Heesang, OH, Byoungchan, SON, Younghwan, KIM, Kyungdo, CHA, Seon-Yong, JEONG, Jae-Goan, HONG, Sung-Joo, SHIN, Hyungcheol
Published in IEEE transactions on electron devices (01.09.2011)

by Lee, Myoung Jin, Jin, Seonghoon, Baek, Chang-Ki, Hong, Sung-Min, Park, Soo-Young, Park, Hong-Hyun, Lee, Sang-Don, Chung, Sung-Woong, Jeong, Jae-Goan, Hong, Sung-Joo, Park, Sung-Wook, Chung, In-Young, Park, Young June, Min, Hong Shick
Published in IEEE transactions on electron devices (01.12.2007)

by Hong, Sung Joo, Kim, Seong Su, Nam, Seunghoon
Published in Corrosion science and technology (28.02.2021)

by Nguyen, Thanh Phuong, Ramadan, Zaher, Hong, Sung Joo, Park, Chan Woo
Published in International journal of heat and mass transfer (15.09.2022)

by KIM, Heesang, OH, Byoungchan, SON, Younghwan, KIM, Kyungdo, CHA, Seon-Yong, JEONG, Jae-Goan, HONG, Sung-Joo, SHIN, Hyungcheol
Published in IEEE transactions on electron devices (01.06.2011)

by LEE, Jung-Kyu, JUNG, Sunghun, CHOE, Byeong-In, PARK, Jinwon, CHUNG, Sung-Woong, JAE SUNG ROH, HONG, Sung-Joo, CHAN HYEONG PARK, PARK, Byung-Gook, LEE, Jong-Ho
Published in IEEE electron device letters (01.02.2013)

by Zheng, Xiru, Ryeon Kim, Byung, Joo Hong, Sung, Lee, Jung-Gil, Woo Park, Chan
Published in Applied thermal engineering (01.05.2024)

by Hong, Sung Joo, Zheng, Xiru, Park, Chan Woo
Published in International communications in heat and mass transfer (01.11.2019)

by LEE, Ga-Won, LEE, Hi-Duck, LIM, Kwan-Yong, YONG SOO KIM, YANG, Hong-Sun, CHO, Gyu-Seog, PARK, Sung-Kye, HONG, Sung-Joo
Published in IEEE electron device letters (01.02.2009)

by Kim, Jin Soo, Park, Si Ho, Kang, Sung-Soo, Kim, Hong Gun, Kwac, Lee Ku, Hong, Sung Joo
Published in Journal of mechanical science and technology (01.06.2024)

by Kim, Heesang, Oh, Byoungchan, Kim, Kyungdo, Cha, Seon-Yong, Jeong, Jae-Goan, Hong, Sung-Joo, Lee, Jong-Ho, Park, Byung-Gook, Shin, Hyungcheol
Published in Japanese Journal of Applied Physics (01.09.2010)

by Lee, Joon Ha, Kim, Dae Hae, Kim, Seong Min, Kim, Min Soo, Kim, In Gwan, Woo, Sung Min, Hong, Sung Joo, Park, Chan Woo
Published in Applied thermal engineering (05.02.2019)

by Lee, Hyunji, Koh, Jae-Whoan, Kim, Young-Ah, Chun, Kyoung-Chul, Han, Jung Yeol, Hwang, Jong Hee, Choi, June-Seek, Joo, Sung Hong, Kwon, Hye-Young
Published in Frontiers in pharmacology (25.04.2022)

by Lee, Hyunji, Koh, Jae-Whoan, Kim, Young-Ah, Chun, Kyoung-Chul, Han, Jung-Yeol, Hwang, Jong Hee, Choi, June-Seek, Joo, Sung-Hong, Kwon, Hye-Young
Published in Frontiers in pharmacology (05.08.2022)

by Tae-Un Youn, Keum-Whan Noh, Sang-Mok Yi, Jong-Wook Kim, Noh-Yong Park, Sung-Chul Shin, Kwang-Hyun Yun, Byung-Kook Kim, Sung-Kye Park, Seok-Kiu Lee, Sung-Joo Hong
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)

by Bak, Hojin, Lee, Horyeong, Kim, Won-Jin, Choi, Inho, Kim, Hanjun, Kim, Dongha, Lee, Hanseung, Han, Sukman, Lee, Kyoung-In, Do, Youngwoong, Cho, Minsu, Baek, Moung-Seok, Kim, Kyungdo, Park, Wonje, Kang, Seong-Hun, Hong, Sung-Joo, Oh, Hoon-Sang, Song, Changrock
Published in 2022 International Electron Devices Meeting (IEDM) (03.12.2022)