Total-dose radiation response of hafnium-silicate capacitors
Felix, J.A., Fleetwood, D.M., Schrimpf, R.D., Hong, J.G., Lucovsky, G., Schwank, J.R., Shaneyfelt, M.R.
Published in IEEE transactions on nuclear science (01.12.2002)
Published in IEEE transactions on nuclear science (01.12.2002)
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A genome-wide analysis of the ultimate pH in swine
Chung, H Y, Lee, K T, Jang, G W, Choi, J G, Hong, J G, Kim, T H
Published in Genetics and molecular research (01.01.2015)
Published in Genetics and molecular research (01.01.2015)
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A spectroscopic study distinguishing between chemical phase separation with different degrees of crystallinity in Hf(Zr) silicate alloys
LUCOVSKY, G, RAYNER, G. B, KANG, D, HINKLE, C. L, HONG, J. G
Published in Applied surface science (15.07.2004)
Published in Applied surface science (15.07.2004)
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Chemical phase separation in Zr silicate alloys: a spectroscopic study distinguishing between chemical phase separation with different degree of micro- and nano-crystallinity
Rayner, G.B., Kang, D., Hinkle, C.L., Hong, J.G., Lucovsky, G.
Published in Microelectronic engineering (01.04.2004)
Published in Microelectronic engineering (01.04.2004)
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Conduction band states of transition metal (TM) high- k gate dielectrics as determined from X-ray absorption spectra
Lucovsky, G., Hong, J.G., Fulton, C.C., Stoute, N.A., Zou, Y., Nemanich, R.J., Aspnes, D.E., Ade, H., Schlom, D.G.
Published in Microelectronics and reliability (01.05.2005)
Published in Microelectronics and reliability (01.05.2005)
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Use of the cytomegalovirus pp65 antigenemia assay for preemptive therapy in allogeneic hematopoietic stem cell transplantation: a real-world review
Tan, B.H., Chlebicka, N.L., Hong Low, J.G., Chong, T.Y.R., Chan, K.P., Goh, Y.T.
Published in Transplant infectious disease (01.10.2008)
Published in Transplant infectious disease (01.10.2008)
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Characterization of the HDP-CVD oxide as interlayer dielectric material for sub-quarter micron CMOS
Kim, J.W., Lee, J.B., Hong, J.G., Hwang, B.K., Kim, S.T., Han, M.S.
Published in Proceedings of the IEEE 1998 International Interconnect Technology Conference (Cat. No.98EX102) (1998)
Published in Proceedings of the IEEE 1998 International Interconnect Technology Conference (Cat. No.98EX102) (1998)
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