Modified Conductance Method for Extraction of Subgap Density of States in a-IGZO Thin-Film Transistors
BAE, Hagyoul, JUN, Sungwoo, YUN, Daeyoun, HONG, Euiyeon, SEO, Hyojoon, DAE HWAN KIM, DONG MYONG KIM, CHOON HYEONG JO, CHOI, Hyunjun, LEE, Jaewook, YUN HYEOK KIM, HWANG, Seonwook, HYUN KWANG JEONG, HUR, Inseok, KIM, Woojoon
Published in IEEE electron device letters (01.08.2012)
Published in IEEE electron device letters (01.08.2012)
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Journal Article
Differential Body-Factor Technique for Characterization of Interface Traps in MOSFETs
Yun, Daeyoun, Bae, Minkyung, Jang, Jaeman, Bae, Hagyoul, Shin, Ja Sun, Hong, Euiyeon, Lee, Jieun, Kim, Dae Hwan, Kim, Dong Myong
Published in IEEE electron device letters (01.09.2011)
Published in IEEE electron device letters (01.09.2011)
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Journal Article