Quantifying the effect of a potential corrective action on product life
Honecker, Sharon L., Yenal, Umur
Published in 2017 Annual Reliability and Maintainability Symposium (RAMS) (2017)
Published in 2017 Annual Reliability and Maintainability Symposium (RAMS) (2017)
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Conference Proceeding
A General Formula for Expected Number of Failures
Szidarovszky, Miklos, Szidarovszky, Ferenc, Honecker, Sharon L.
Published in 2018 Annual Reliability and Maintainability Symposium (RAMS) (01.01.2018)
Published in 2018 Annual Reliability and Maintainability Symposium (RAMS) (01.01.2018)
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Conference Proceeding
Reliability estimation for one-shot systems with zero component test failures
Huairui Guo, Honecker, Sharon, Mettas, Adamantios, Ogden, Doug
Published in 2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS) (01.01.2010)
Published in 2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS) (01.01.2010)
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Conference Proceeding
MRI velocimetry in microchannel networks
Raguin, L.G., Honecker, S.L., Georgiadis, J.G.
Published in 2005 3rd IEEE/EMBS Special Topic Conference on Microtechnology in Medicine and Biology (2005)
Published in 2005 3rd IEEE/EMBS Special Topic Conference on Microtechnology in Medicine and Biology (2005)
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Conference Proceeding