Search Results - "Holman, W. Timothy" :: K.UTB vyhledávací portál | TBU Library Retrieval Portal

On-Chip Emulation and Measurement of Variable-Length Photocurrents in Sub-50nm ICs

On-Chip Emulation and Measurement of Variable-Length Photocurrents in Sub-50nm ICs

by D'Amico, Joseph V., Vibbert, Sean T., Cadena, Rick M., Alles, Michael L., Ball, Dennis R., Sternberg, Andrew L., Zhang, En Xia, Holman, W. Timothy, Kauppila, Jeffrey S., Massengill, Lloyd W.
Published in IEEE transactions on nuclear science (01.04.2024)

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Journal Article

Analysis of Bulk FinFET Structural Effects on Single-Event Cross Sections

Analysis of Bulk FinFET Structural Effects on Single-Event Cross Sections

by Nsengiyumva, Patrick, Massengill, Lloyd W., Alles, Michael L., Bhuva, Bharat L., Ball, Dennis R., Kauppila, Jeffrey S., Haeffner, Timothy D., Holman, W. Timothy, Reed, Robert A.
Published in IEEE transactions on nuclear science (01.01.2017)

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Journal Article

A Comparison of the SEU Response of Planar and FinFET D Flip-Flops at Advanced Technology Nodes

A Comparison of the SEU Response of Planar and FinFET D Flip-Flops at Advanced Technology Nodes

by Nsengiyumva, Patrick, Ball, Dennis R., Kauppila, Jeffrey S., Tam, Nelson, McCurdy, Mike, Holman, W. Timothy, Alles, Michael L., Bhuva, Bharat L., Massengill, Lloyd W.
Published in IEEE transactions on nuclear science (01.02.2016)

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Journal Article

Angular Effects on Single-Event Mechanisms in Bulk FinFET Technologies

Angular Effects on Single-Event Mechanisms in Bulk FinFET Technologies

by Nsengiyumva, Patrick, Massengill, Lloyd W., Kauppila, Jeffrey S., Maharrey, Jeffrey A., Harrington, Rachel C., Haeffner, Timothy D., Ball, Dennis R., Alles, Michael L., Bhuva, Bharat L., Holman, W. Timothy, Zhang, En Xia, Rowe, Jason D., Sternberg, Andrew L.
Published in IEEE transactions on nuclear science (01.01.2018)

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Journal Article

Effect of Transistor Density and Charge Sharing on Single-Event Transients in 90-nm Bulk CMOS

Effect of Transistor Density and Charge Sharing on Single-Event Transients in 90-nm Bulk CMOS

by Atkinson, N. M., Ahlbin, J. R., Witulski, A. F., Gaspard, N. J., Holman, W. T., Bhuva, B. L., Zhang, E. X., Li Chen, Massengill, L. W.
Published in IEEE transactions on nuclear science (01.12.2011)

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Journal Article

Neutron and alpha particle-induced transients in 90 nm technology

Neutron and alpha particle-induced transients in 90 nm technology

by Narasimham, B., Gadlage, M.J., Bhuva, B.L., Schrimpf, R.D., Massengill, L.W., Holman, W.T., Witulski, A.F., Xiaowei Zhu, Balasubramanian, A., Wender, S.A.
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)

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Conference Proceeding

A Generalized Linear Model for Single Event Transient Propagation in Phase-Locked Loops

A Generalized Linear Model for Single Event Transient Propagation in Phase-Locked Loops

by Loveless, T D, Massengill, L W, Holman, W T, Bhuva, B L, McMorrow, D, Warner, J H
Published in IEEE transactions on nuclear science (01.10.2010)

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Journal Article

Impact of Well Structure on Single-Event Well Potential Modulation in Bulk CMOS

Impact of Well Structure on Single-Event Well Potential Modulation in Bulk CMOS

by Gaspard, N. J., Witulski, A. F., Atkinson, N. M., Ahlbin, J. R., Holman, W. T., Bhuva, B. L., Loveless, T. D., Massengill, L. W.
Published in IEEE transactions on nuclear science (01.12.2011)

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Journal Article

Effect of Negative Bias Temperature Instability on the Single Event Upset Response of 40 nm Flip-Flops

Effect of Negative Bias Temperature Instability on the Single Event Upset Response of 40 nm Flip-Flops

by Kauppila, A. V., Bhuva, B. L., Loveless, T. D., Jagannathan, S., Gaspard, N. J., Kauppila, J. S., Massengill, L. W., Wen, S. J., Wong, R., Vaughn, G. L., Holman, W. T.
Published in IEEE transactions on nuclear science (01.12.2012)

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Journal Article

A Probabilistic Analysis Technique Applied to a Radiation-Hardened-by-Design Voltage-Controlled Oscillator for Mixed-Signal Phase-Locked Loops

A Probabilistic Analysis Technique Applied to a Radiation-Hardened-by-Design Voltage-Controlled Oscillator for Mixed-Signal Phase-Locked Loops

by Loveless, T.D., Massengill, L.W., Bhuva, B.L., Holman, W.T., Casey, M.C., Reed, R.A., Nation, S.A., McMorrow, D., Melinger, J.S.
Published in IEEE transactions on nuclear science (01.12.2008)

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Journal Article

Layout Technique for Single-Event Transient Mitigation via Pulse Quenching

Layout Technique for Single-Event Transient Mitigation via Pulse Quenching

by Atkinson, N M, Witulski, A F, Holman, W T, Ahlbin, J R, Bhuva, B L, Massengill, L W
Published in IEEE transactions on nuclear science (01.06.2011)

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Journal Article

Effects of Guard Bands and Well Contacts in Mitigating Long SETs in Advanced CMOS Processes

Effects of Guard Bands and Well Contacts in Mitigating Long SETs in Advanced CMOS Processes

by Narasimham, B., Bhuva, B.L., Schrimpf, R.D., Massengill, L.W., Gadlage, M.J., Holman, T.W., Witulski, A.F., Robinson, W.H., Black, J.D., Benedetto, J.M., Eaton, P.H.
Published in IEEE transactions on nuclear science (01.06.2008)

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Journal Article

Analysis of Single-Event Transients in Integer- N Frequency Dividers and Hardness Assurance Implications for Phase-Locked Loops

Analysis of Single-Event Transients in Integer- N Frequency Dividers and Hardness Assurance Implications for Phase-Locked Loops

by Loveless, T.D., Olson, B.D., Bhuva, B.L., Holman, W.T., Hafer, C.C., Massengill, L.W.
Published in IEEE transactions on nuclear science (01.12.2009)

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Journal Article

A Bulk Built-In Voltage Sensor to Detect Physical Location of Single-Event Transients

A Bulk Built-In Voltage Sensor to Detect Physical Location of Single-Event Transients

by Zhang, Zhichao, Ren, Yi, Chen, Li, Gaspard, Nelson J., Witulski, Arthur. F., Holman, Timothy W., Bhuva, Bharat L., Wen, Shi-Jie, Sammynaiken, Ramaswami
Published in Journal of electronic testing (01.04.2013)

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Journal Article

A Built-In Self-Test (BIST) Technique for Single-Event Testing in Digital Circuits

A Built-In Self-Test (BIST) Technique for Single-Event Testing in Digital Circuits

by Balasubramanian, A., Bhuva, B.L., Massengill, L.W., Narasimham, B., Shuler, R.L., Loveless, T.D., Holman, W.T.
Published in IEEE transactions on nuclear science (01.12.2008)

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Journal Article

Creating Simple and Effective Prerecorded Web-Based Lectures

Creating Simple and Effective Prerecorded Web-Based Lectures

by Holman, W. Timothy
Published in Journal of engineering education (Washington, D.C.) (01.07.1999)

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Journal Article

A Bulk Built-In Voltage Sensor to Detect Physical Location of Single-Event Transients

A Bulk Built-In Voltage Sensor to Detect Physical Location of Single-Event Transients

by Zhang, Zhichao, Ren, Yi, Chen, Li, Gaspard, Nelson J., Witulski, Arthur. F., Holman, Timothy W., Bhuva, Bharat L., Wen, Shi-Jie, Sammynaiken, Ramaswami
Published in Journal of electronic testing (01.04.2013)

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Journal Article

A New Error Correction Circuit for Delay Locked Loops

A New Error Correction Circuit for Delay Locked Loops

by Maillard, Pierre, Holman, W. Timothy, Loveless, T. Daniel, Massengill, Lloyd W.
Published in IEEE transactions on nuclear science (01.12.2013)

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Journal Article

An RHBD Technique to Mitigate Missing Pulses in Delay Locked Loops

An RHBD Technique to Mitigate Missing Pulses in Delay Locked Loops

by Maillard, P, Holman, W T, Loveless, T D, Bhuva, B L, Massengill, L W
Published in IEEE transactions on nuclear science (01.12.2010)

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Journal Article

RHBD Technique for Single-Event Charge Cancellation in Folded-Cascode Amplifiers

RHBD Technique for Single-Event Charge Cancellation in Folded-Cascode Amplifiers

by Atkinson, N. M., Blaine, R. W., Kauppila, J. S., Armstrong, S. E., Loveless, T. Daniel, Hooten, N. C., Holman, W. T., Massengill, L. W., Warner, J. H.
Published in IEEE transactions on nuclear science (01.08.2013)

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Journal Article