Effects of Guard Bands and Well Contacts in Mitigating Long SETs in Advanced CMOS Processes
Narasimham, B., Bhuva, B.L., Schrimpf, R.D., Massengill, L.W., Gadlage, M.J., Holman, T.W., Witulski, A.F., Robinson, W.H., Black, J.D., Benedetto, J.M., Eaton, P.H.
Published in IEEE transactions on nuclear science (01.06.2008)
Published in IEEE transactions on nuclear science (01.06.2008)
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