Towards the Automation of Non-destructive Fault Recognition: Enhancement of Robustness and Accuracy Through AI Powered Acoustic and Thermal Signal Analysis in Time, Frequency- and Time-Frequency Domains
Brand, Sebastian, Altmann, Frank, Grosse, Christian, Kögel, Michael, Hollerith, Christian, Gounet, Pascal
Published in Journal of failure analysis and prevention (01.10.2024)
Published in Journal of failure analysis and prevention (01.10.2024)
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Journal Article
Advances in High-Resolution Non-Destructive Defect Detection and Localization Enhanced by Intelligent Signal Processing
Brand, Sebastian, Kogel, Michael, Grosse, Christian, Gounet, Pascal, Hollerith, Christian, Altmann, Frank
Published in 2024 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (15.07.2024)
Published in 2024 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (15.07.2024)
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Conference Proceeding
Recognizing Named Entities in Failure Analysis Reports
Grabner, Corinna, Safont-Andreu, Anna, Burmer, Christian, Hollerith, Christian, Schekotihin, Konstantin
Published in 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (24.07.2023)
Published in 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (24.07.2023)
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Conference Proceeding
Comparison of deep learning-based image segmentation methods for the detection of voids in X-ray images of microelectronic components
Schiele, Tobias, Jansche, Andreas, Bernthaler, Timo, Kaiser, Anton, Pfister, Daniel, Spath-Stockmeier, Stefan, Hollerith, Christian
Published in 2021 IEEE 17th International Conference on Automation Science and Engineering (CASE) (23.08.2021)
Published in 2021 IEEE 17th International Conference on Automation Science and Engineering (CASE) (23.08.2021)
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Conference Proceeding
Advanced package circuit modification by μMilling
Hollerith, Christian, Kruger, Bernd, Gezerci, Gurcan, Pauthner, Siegfried, Zimmermann, Gunnar
Published in Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.06.2014)
Published in Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.06.2014)
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Conference Proceeding
Artificial Intelligence Applications in Semiconductor Failure Analysis
Safont-Andreu, Anna, Schekotihin, Konstantin, Burmer, Christian, Hollerith, Christian, Ming, Xue
Published in Electronic device failure analysis (01.05.2023)
Published in Electronic device failure analysis (01.05.2023)
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Magazine Article