Energy dispersive X-ray spectroscopy with microcalorimeters
Hollerith, C., Wernicke, D., Bühler, M., Feilitzsch, F.v., Huber, M., Höhne, J., Hertrich, T., Jochum, J., Phelan, K., Stark, M., Simmnacher, B., Weiland, W., Westphal, W.
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (11.03.2004)
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (11.03.2004)
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Journal Article
X-ray microanalysis with microcalorimeters
Isaila, C., Feilitzsch, F.v., Höhne, J., Hollerith, C., Phelan, K., Simmnacher, B., Weiland, R., Wernicke, D.
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (15.04.2006)
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (15.04.2006)
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Journal Article
Semiconductor material analysis based on microcalorimeter EDS
Simmnacher, B., Weiland, R., Höhne, J., Feilitzsch, F.v., Hollerith, C.
Published in Microelectronics and reliability (01.09.2003)
Published in Microelectronics and reliability (01.09.2003)
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Journal Article
Superconducting tunnel junctions as detectors for high-resolution x-ray spectroscopy
Huber, M., Angloher, G., Hollerith, C., Ruedig, A., Jochum, J., Potzel, W., Feilitzsch, F. v.
Published in X-ray spectrometry (01.07.2004)
Published in X-ray spectrometry (01.07.2004)
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Journal Article
Conference Proceeding
Influence of sample preparation on intrinsic stresses inside a model Chip - First results of partial decapsulation
Schaffus, T., Albert, P., Breuer, W., Debie, D., Graml, M., Hollerith, C., Kroninger, F., Mack, W., Pfaff, H., Schaffus, M., Walter, J.
Published in Microelectronics and reliability (01.09.2018)
Published in Microelectronics and reliability (01.09.2018)
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Journal Article
Cryogenic detector systems for materials analysis
Hoehne, J, Hess, U, Buehler, M, v Feilitzsch, F, Jochum, J, v Hentig, R, Hertrith, T, Hollerith, C, Huber, M, Nikolosi, J
Published in AIP Conference Proceedings (01.01.2002)
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Published in AIP Conference Proceedings (01.01.2002)
Conference Proceeding
Cryogenic detector systems for materials analysis
Hohne, J., Buhler, M., Feilitzsch, F.V., Jochum, J., Hertrich, T., Hollerith, C., Huber, M., Nicolosi, J., Phelan, K., Redfern, D., Simmnacher, B., Weiland, R., Wernicke, D.
Published in Proceedings of the 5th European Workshop on Low Temperature Electronics (2002)
Published in Proceedings of the 5th European Workshop on Low Temperature Electronics (2002)
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Conference Proceeding