Electroreflectance study of macroporous silicon surfaces
Holiney, R.Yu, Matveeva, L.A, Venger, E.F, Livinenko, A.O, Karachevtseva, L.A
Published in Applied surface science (15.03.2001)
Published in Applied surface science (15.03.2001)
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Journal Article
Effect of the Si wafer pretreatment on the patterned substrate morphology and growth of Hg 1−x Cd x Te PLD films
Gorbach, T.Ya, Holiney, R.Yu, Matveeva, L.A, Svechnikov, S.V, Venger, E.F, Kuzma, M, Wisz, G
Published in Materials science & engineering. B, Solid-state materials for advanced technology (01.02.2000)
Published in Materials science & engineering. B, Solid-state materials for advanced technology (01.02.2000)
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Journal Article
Investigation of the undersurface damaged layers in silicon wafers
Holiney, R.Yu, Matveeva, L.A., Venger, E.F.
Published in Semiconductor physics, quantum electronics, and optoelectronics (17.12.1999)
Published in Semiconductor physics, quantum electronics, and optoelectronics (17.12.1999)
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Journal Article
Growth of III–V semiconductor layers on Si patterned substrates
Gorbach, T.Ya, Holiney, R.Yu, Matveeva, L.A, Smertenko, P.S, Svechnikov, S.V, Venger, E.F, Ciach, R, Faryna, M
Published in Thin solid films (30.12.1998)
Published in Thin solid films (30.12.1998)
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Journal Article
Conference Proceeding
Electroreflectance spectroscopy and scanning electron microscopy study of microrelief silicon wafers with various surface pretreatments
Gorbach, T.Ya, Holiney, R.Yu, Matiyuk, I.M., Matveeva, L.A., Svechnikov, S.V., Venger, E.F.
Published in Semiconductor physics, quantum electronics, and optoelectronics (01.12.1998)
Published in Semiconductor physics, quantum electronics, and optoelectronics (01.12.1998)
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Journal Article