by Shealy, Jeffrey B., Vetury, Ramakrishna, Gibb, Shawn R., Hodge, Michael D., Patel, Pinal, McLain, Michael A., Feldman, Alexander Yu, Boomgarden, Mark D., Lewis, Michael P., Hosse, Brook, Holden, Rohan
Published in 2017 IEEE MTT-S International Microwave Symposium (IMS) (01.06.2017)