Comeback of epitaxial graphene for electronics: large-area growth of bilayer-free graphene on SiC
Kruskopf, Mattias, Pakdehi, Davood Momeni, Pierz, Klaus, Wundrack, Stefan, Stosch, Rainer, Dziomba, Thorsten, Götz, Martin, Baringhaus, Jens, Aprojanz, Johannes, Tegenkamp, Christoph, Lidzba, Jakob, Seyller, Thomas, Hohls, Frank, Ahlers, Franz J, Schumacher, Hans W
Published in 2d materials (01.12.2016)
Published in 2d materials (01.12.2016)
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Journal Article
Top-down GaN nanowire transistors with nearly zero gate hysteresis for parallel vertical electronics
Fatahilah, Muhammad Fahlesa, Yu, Feng, Strempel, Klaas, Römer, Friedhard, Maradan, Dario, Meneghini, Matteo, Bakin, Andrey, Hohls, Frank, Schumacher, Hans Werner, Witzigmann, Bernd, Waag, Andreas, Wasisto, Hutomo Suryo
Published in Scientific reports (16.07.2019)
Published in Scientific reports (16.07.2019)
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Journal Article
Counting statistics for electron capture in a dynamic quantum dot
Fricke, Lukas, Wulf, Michael, Kaestner, Bernd, Kashcheyevs, Vyacheslavs, Timoshenko, Janis, Nazarov, Pavel, Hohls, Frank, Mirovsky, Philipp, Mackrodt, Brigitte, Dolata, Ralf, Weimann, Thomas, Pierz, Klaus, Schumacher, Hans W
Published in Physical review letters (20.03.2013)
Published in Physical review letters (20.03.2013)
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Journal Article
Tailoring Permanent Charge Carrier Densities in Epitaxial Graphene on SiC by Functionalization with F4‐TCNQ
Yin, Yefei, Chatterjee, Atasi, Momeni, Davood, Kruskopf, Mattias, Götz, Martin, Wundrack, Stefan, Hohls, Frank, Pierz, Klaus, Schumacher, Hans W.
Published in Advanced Physics Research (01.12.2022)
Published in Advanced Physics Research (01.12.2022)
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Journal Article
Measurement of finite-frequency current statistics in a single-electron transistor
Ubbelohde, Niels, Fricke, Christian, Flindt, Christian, Hohls, Frank, Haug, Rolf J.
Published in Nature communications (03.01.2012)
Published in Nature communications (03.01.2012)
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Journal Article
Trapping and Counting Ballistic Nonequilibrium Electrons
Freise, Lars, Gerster, Thomas, Reifert, David, Weimann, Thomas, Pierz, Klaus, Hohls, Frank, Ubbelohde, Niels
Published in Physical review letters (27.03.2020)
Published in Physical review letters (27.03.2020)
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Journal Article
Two electrons interacting at a mesoscopic beam splitter
Ubbelohde, Niels, Freise, Lars, Pavlovska, Elina, Silvestrov, Peter G., Recher, Patrik, Kokainis, Martins, Barinovs, Girts, Hohls, Frank, Weimann, Thomas, Pierz, Klaus, Kashcheyevs, Vyacheslavs
Published in Nature nanotechnology (01.07.2023)
Published in Nature nanotechnology (01.07.2023)
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Journal Article
Partitioning of on-demand electron pairs
Ubbelohde, Niels, Hohls, Frank, Kashcheyevs, Vyacheslavs, Wagner, Timo, Fricke, Lukas, Kästner, Bernd, Pierz, Klaus, Schumacher, Hans W., Haug, Rolf J.
Published in Nature nanotechnology (01.01.2015)
Published in Nature nanotechnology (01.01.2015)
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Journal Article
Roadmap on quantum nanotechnologies
Laucht, Arne, Hohls, Frank, Ubbelohde, Niels, Fernando Gonzalez-Zalba, M, Reilly, David J, Stobbe, Søren, Schröder, Tim, Scarlino, Pasquale, Koski, Jonne V, Dzurak, Andrew, Yang, Chih-Hwan, Yoneda, Jun, Kuemmeth, Ferdinand, Bluhm, Hendrik, Pla, Jarryd, Hill, Charles, Salfi, Joe, Oiwa, Akira, Muhonen, Juha T, Verhagen, Ewold, LaHaye, M D, Kim, Hyun Ho, Tsen, Adam W, Culcer, Dimitrie, Geresdi, Attila, Mol, Jan A, Mohan, Varun, Jain, Prashant K, Baugh, Jonathan
Published in Nanotechnology (16.04.2021)
Published in Nanotechnology (16.04.2021)
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Journal Article
Self-referenced single-electron quantized current source
Fricke, Lukas, Wulf, Michael, Kaestner, Bernd, Hohls, Frank, Mirovsky, Philipp, Mackrodt, Brigitte, Dolata, Ralf, Weimann, Thomas, Pierz, Klaus, Siegner, Uwe, Schumacher, Hans W
Published in Physical review letters (06.06.2014)
Published in Physical review letters (06.06.2014)
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Journal Article
Microwave Interferometry for High Sensitivity VNA-FMR Measurements
Sievers, Sibylle, Kurda, Joschua, Liebing, Niklas, Hohls, Frank, Schumacher, Hans W.
Published in IEEE transactions on magnetics (01.04.2017)
Published in IEEE transactions on magnetics (01.04.2017)
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Journal Article
Quantum Hall Resistance Standards Based on Epitaxial Graphene with Different Doping Layer Sequence
Yin, Yefei, Kruskopf, Mattias, Chatterjee, Atasi, Bauer, Stephan, Tschirner, Teresa, Gotz, Martin, Hohls, Frank, Pierz, Klaus, Schumacher, Hans W.
Published in 2024 Conference on Precision Electromagnetic Measurements (CPEM) (08.07.2024)
Published in 2024 Conference on Precision Electromagnetic Measurements (CPEM) (08.07.2024)
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Conference Proceeding
High cumulants in the counting statistics measured for a quantum dot
Fricke, Christian, Hohls, Frank, Flindt, Christian, Haug, Rolf J.
Published in Physica. E, Low-dimensional systems & nanostructures (01.02.2010)
Published in Physica. E, Low-dimensional systems & nanostructures (01.02.2010)
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Journal Article
Conference Proceeding
Admittance of a quantum point contact
Hohls, Frank, Fricke, Christian, Haug, Rolf J.
Published in Physica. E, Low-dimensional systems & nanostructures (01.03.2008)
Published in Physica. E, Low-dimensional systems & nanostructures (01.03.2008)
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Journal Article
Conference Proceeding
Accuracy verification of single-electron pumps with 0.2 ppm uncertainty
Stein, Friederike, Gerster, Thomas, Behr, Ralf, Götz, Martin, Pesel, Eckart, Weimann, Thomas, Pierz, Klaus, Schumacher, Hans Werner, Hohls, Frank
Published in 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) (01.07.2016)
Published in 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) (01.07.2016)
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Conference Proceeding
Journal Article
Die Kunst des Elektronenzählens
Fricke, Lukas, Dolata, Ralf, Kästner, Bernd, Hohls, Frank, Schumacher, Hans Werner
Published in Physik in unserer Zeit (2015)
Published in Physik in unserer Zeit (2015)
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Journal Article
A self-referenced single-electron current source
Hohls, Frank, Fricke, Lukas, Wulf, Michael, Kaestner, Bernd, Mirovsky, Philipp, Mackrodt, Birgit, Dolata, Ralf, Weimann, Thomas, Pierz, Klaus, Siegner, Uwe, Schumacher, Hans W.
Published in 29th Conference on Precision Electromagnetic Measurements (CPEM 2014) (01.08.2014)
Published in 29th Conference on Precision Electromagnetic Measurements (CPEM 2014) (01.08.2014)
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Conference Proceeding
Journal Article