Simulating single-event burnout of n-channel power MOSFET's
Johnson, G.H., Hohl, J.H., Schrimpf, R.D., Galloway, K.F.
Published in IEEE transactions on electron devices (01.05.1993)
Published in IEEE transactions on electron devices (01.05.1993)
Get full text
Journal Article
Features of the triggering mehanism for single event burnout of power MOSFES
Hohl, J.H., Johnson, G.H.
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) (01.12.1989)
Get full text
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) (01.12.1989)
Conference Proceeding
Challenges of a vintage 1994 CMOS logic chip
Hohl, J.H., Johnson, B.C.
Published in Proceedings of the IEEE 1988 Custom Integrated Circuits Conference (1988)
Published in Proceedings of the IEEE 1988 Custom Integrated Circuits Conference (1988)
Get full text
Conference Proceeding
Prediction of error probabilities for integrated digital synchronizers
Hohl, J.H., Larsen, W.R., Schooley, L.C.
Published in IEEE journal of solid-state circuits (01.04.1984)
Published in IEEE journal of solid-state circuits (01.04.1984)
Get full text
Journal Article
An adaptive CMOS transmission line driver
Patel, H.N., Hohl, J.H., Oalusinski, O.A.
Published in Sixth Annual IEEE International ASIC Conference and Exhibit (1993)
Published in Sixth Annual IEEE International ASIC Conference and Exhibit (1993)
Get full text
Conference Proceeding
A Design Database For Stripline Interconnections
Hohl, J.H., Palusinski, O.A., Menezes, K.F., Patel, H.N., Smith, S.M.
Published in Thirteenth IEEE/CHMT International Electronics Manufacturing Technology Symposium (1992)
Published in Thirteenth IEEE/CHMT International Electronics Manufacturing Technology Symposium (1992)
Get full text
Conference Proceeding