RF ESD protection strategies: Codesign vs. low- C protection
Soldner, W., Streibl, M., Hodel, U., Tiebout, M., Gossner, H., Schmitt-Landsiedel, D., Chun, J.H., Ito, C., Dutton, R.W.
Published in Microelectronics and reliability (01.07.2007)
Published in Microelectronics and reliability (01.07.2007)
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Conference Proceeding
An InAlAs-InGaAs OPFET with responsivity above 200 A/W at 1.3-μm wavelength
Marso, M., Gersdorf, P., Fox, A., Forster, A., Hodel, U., Lambertini, R., Kordos, P.
Published in IEEE photonics technology letters (01.01.1999)
Published in IEEE photonics technology letters (01.01.1999)
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A combined ultrahigh vacuum scanning tunneling-scanning electron microscope system
HODEL, U, MEMMERT, U, HARTMANN, U
Published in Fresenius' journal of analytical chemistry (21.05.1997)
Published in Fresenius' journal of analytical chemistry (21.05.1997)
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Journal Article
A novel InAlAs/InGaAs layer structure for monolithically integrated photoreceiver
Hodel, U., Orzati, A., Marso, M., Homan, O., Fox, A., Hart, A.V.D., Forster, A., Kordos, P., Luth, H.
Published in Conference Proceedings. 2000 International Conference on Indium Phosphide and Related Materials (Cat. No.00CH37107) (2000)
Published in Conference Proceedings. 2000 International Conference on Indium Phosphide and Related Materials (Cat. No.00CH37107) (2000)
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Conference Proceeding
A digitally controlled DC-DC converter for SoC in 28nm CMOS
Kuttner, F, Habibovic, H, Hartig, T, Fulde, M, Babin, G, Santner, A, Bogner, P, Kropf, C, Riesslegger, H, Hodel, U
Published in 2011 IEEE International Solid-State Circuits Conference (01.02.2011)
Published in 2011 IEEE International Solid-State Circuits Conference (01.02.2011)
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Conference Proceeding
Evaluation of FinFET RF Building Blocks
Knoblinger, G., Fulde, M., Siprak, D., Hodel, U., Von Arnim, K., Schulz, T., Pacha, C., Baumann, U., Marshall, A., Xiong, W., Cleavelin, C.R., Patruno, P., Schruefer, K.
Published in 2007 IEEE International SOI Conference (01.10.2007)
Published in 2007 IEEE International SOI Conference (01.10.2007)
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Conference Proceeding
An InAlAs-InGaAs OPFET with responsivity above 200 A/W at 1.3-mum wavelength
Marso, M, Gersdorf, P, Fox, A, ster, A, Hodel, U, Lambertini, R, Kordos, P
Published in IEEE photonics technology letters (01.01.1999)
Published in IEEE photonics technology letters (01.01.1999)
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Journal Article
RF ESD protection strategies: Codesign vs. low-C protection
Soldner, W., Streibl, M., Hodel, U., Tiebout, M., Gossner, H., Schmitt-Landsiedel, D., Chun, J.H., Ito, C., Dutton, R.W.
Published in 2005 Electrical Overstress/Electrostatic Discharge Symposium (01.09.2005)
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Published in 2005 Electrical Overstress/Electrostatic Discharge Symposium (01.09.2005)
Conference Proceeding
Integration of high-performance, low-leakage and mixed signal features into a 100nm CMOS technology
SCHAFBAUER, Thomas, BRIGHTEN, James, HUANG, Shih-Fen, YIMIN HUANG, KALTALIOGLU, Erdem, KNOBLINGER, Gerhard, LEE, Ming-Tsan, LESLIE, Alan, LEUNG, Pak, LI, Baozhen, CHUAN LIN, LIN, Yi-Hsiung, CHEN, Yi-Cheng, NISSL, Walter, NGUYEN, Phung, OLBRICH, Alexander, RIESS, Philipp, ROVEDO, Nivo, SPORTOUCH, Sandrine, THOMAS, Al, VIETZKE, Dirk, WENDEL, Martin, WONG, Robert, CLEVENGER, Larry, QIUYI YE, LIN, Kun-Chi, SCHIML, Thomas, WANN, Clement, COMMONS, Martin, COWLEY, Andy, ESMARK, Kai, GRASSMANN, Andreas, HODEL, Uwe, HUANG, Hsiang-Jen
Year of Publication 2002
Year of Publication 2002
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Integration of high-performance, low-leakage and mixed signal features into a 100 nm CMOS technology
Schafbauer, T., Brighten, J., Yi-Cheng Chen, Clevenger, L., Commons, M., Cowley, A., Esmark, K., Grassmann, A., Hodel, U., Hsiang-Jen Huang, Shih-Fen Huang, Yimin Huang, Kaltalioglu, E., Knoblinger, G., Ming-Tsan Lee, Leslie, A., Pak Leung, Baozhen Li, Chuan Lin, Yi-Hsiung Lin, Nissl, W., Phung Nguyen, Olbrich, A., Riess, P., Rovedo, N., Sportouch, S., Thomas, A., Vietzke, D., Wendel, M., Robert Wong, Qiuyi Ye, Kun-Chi Lin, Schiml, T., Wann, C.
Published in 2002 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.01CH37303) (2002)
Published in 2002 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.01CH37303) (2002)
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