by Anaya, J., Bai, T., Wang, Y., Li, C., Goorsky, M., Bougher, T.L., Yates, L., Cheng, Z., Graham, S., Hobart, K.D., Feygelson, T.I., Tadjer, M.J., Anderson, T.J., Pate, B.B., Kuball, M.
Published in Acta materialia (15.10.2017)

by Anderson, T.J, Feigelson, B.N, Kub, F.J, Tadjer, M.J, Hobart, K.D, Mastro, M.A, Hite, J.K, Eddy, C.R
Published in Electronics letters (30.01.2014)

by Gallagher, J.C., Anderson, T.J., Luna, L.E., Koehler, A.D., Hite, J.K., Mahadik, N.A., Hobart, K.D., Kub, F.J.
Published in Journal of crystal growth (15.01.2019)

by Anderson, T.J., Gallagher, J.C., Luna, L.E., Koehler, A.D., Jacobs, A.G., Xie, J., Beam, E., Hobart, K.D., Feigelson, B.N.
Published in Journal of crystal growth (01.10.2018)

by Anderson, T.J., Tadjer, M.J., Mastro, M.A., Hite, J.K., Hobart, K.D., Eddy, C.R., Kub, F.J.
Published in IEEE electron device letters (01.12.2009)

by Hull, B.A., Sumakeris, J.J., O'Loughlin, M.J., Qingchun Zhang, Richmond, J., Powell, A.R., Imhoff, E.A., Hobart, K.D., Rivera-Lopez, A., Hefner, A.R.
Published in IEEE transactions on electron devices (01.08.2008)

by Anderson, T.J., Tadjer, M.J., Mastro, M.A., Hite, J.K., Hobart, K.D., Eddy, C.R., Kub, F.J.
Published in Journal of electronic materials (01.05.2010)

by Haizhou Yin, Hobart, K.D., Peterson, R.L., Kub, F.J., Sturm, J.C.
Published in IEEE transactions on electron devices (01.10.2005)

by Wulf, E.A., Phlips, B.F., Hobart, K.D., Kub, F.J., Kurfess, J.D.
Published in IEEE transactions on nuclear science (01.04.2008)

by Rommel, S.L., Dillon, T.E., Berger, P.R., Thompson, P.E., Hobart, K.D., Lake, R., Seabaugh, A.C.
Published in IEEE electron device letters (01.07.1999)

by Hobart, K.D., Godbey, D.J., Twigg, M.E., Fatemi, M., Thompson, P.E., Simons, D.S.
Published in Surface science (10.07.1995)

by Liang, J., Huang, R., Yin, H., Sturm, J.C., Hobart, K.D., Suo, Z.
Published in Acta materialia (28.06.2002)

by Giles, A.J., Caldwell, J.D., Stahlbush, R.E., Hull, B.A., Mahadik, N.A., Glembocki, O.J., Hobart, K.D., Liu, K.X.
Published in Journal of electronic materials (01.06.2010)

by Anderson, T.J., Pate, B.B., Binari, S.C., Eddy, C.R., Hobart, K.D., Tadjer, M.J., Feygelson, T.I., Imhoff, E.A., Meyer, D.J., Katzer, D.S., Hite, J.K., Kub, F.J.
Published in 70th Device Research Conference (01.06.2012)

by Magno, R., Boos, J.B., Campbell, P.M., Bennett, B.R., Glaser, E.R., Tinkham, B.P., Ancona, M.G., Hobart, K.D., Park, D., Papanicolaou, N.A.
Published in Electronics letters (17.03.2005)

by Tadjer, M.J., Hobart, K.D., Stahlbush, R.E., McMarr, P.J., Hughes, H.L., Imhoff, E.A., Kub, F.J., Haney, S.K.
Published in 2009 IEEE Nuclear Science Symposium Conference Record (NSS/MIC) (01.10.2009)

by Jin, N., Berger, P.R., Rommel, S.L., Thompson, P.E., Hobart, K.D.
Published in Electronics letters (08.11.2001)

by Phlips, B.F., Kurfess, J.D., Kub, F.J., Hobart, K.D.
Published in IEEE Nuclear Science Symposium Conference Record, 2005 (2005)

by Thompson, P.E, Hobart, K.D, Twigg, M.E, Rommel, S.L, Jin, N, Berger, P.R, Lake, R, Seabaugh, A.C, Chi, P.H, Simons, D.S
Published in Thin solid films (22.12.2000)

by Phlips, B.F., Hobart, K.D., Kub, F.J., Stahlbush, R.E., Das, M.K., Hull, B.A., De Geronimo, G., O'Connor, P.
Published in IEEE Nuclear Science Symposium Conference Record, 2005 (2005)