Investigation of thermal breakdown mechanism in 0. 13 /spl mu/m technology ggNMOS under ESD conditions
Hillkirk, L.M., Jung-Hoon Chun, Dutton, R.W.
Published in International Conference on Simulation of Semiconductor Processes and Devices, 2003. SISPAD 2003 (2003)
Published in International Conference on Simulation of Semiconductor Processes and Devices, 2003. SISPAD 2003 (2003)
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Conference Proceeding
Dynamic avalanche in 3.3-kV Si power diodes
Domeij, M., Breitholtz, B., Hillkirk, L.M., Linnros, J., Ostling, M.
Published in IEEE transactions on electron devices (01.04.1999)
Published in IEEE transactions on electron devices (01.04.1999)
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Journal Article