A New High-Throughput Focused MeV Ion-Beam Analysis Setup
Möller, Sören, Höschen, Daniel, Kurth, Sina, Esser, Gerwin, Hiller, Albert, Scholtysik, Christian, Dellen, Christian, Linsmeier, Christian
Published in Instruments (Basel) (28.02.2021)
Published in Instruments (Basel) (28.02.2021)
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Journal Article
Impact of Surface Roughness on Ion-Surface Interactions Studied with Energetic Carbon Ions 13C+ on Tungsten Surfaces
Hellwig, Maren, Köppen, Martin, Hiller, Albert, Koslowski, Hans, Litnovsky, Andrey, Schmid, Klaus, Schwab, Christian, De Souza, Roger
Published in Condensed matter (05.03.2019)
Published in Condensed matter (05.03.2019)
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Journal Article
MEGAELECTRONVOLT-BASED ION BEAM ANALYSIS APPARATUS
MÖLLER, Sören, HÖSCHEN, Daniel, LINSMEIER, Christian, ESSER, Gerwin, KURTH, Sina, HILLER, Albert, Martin, SCHOLTYSIK, Christian
Year of Publication 15.02.2023
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Year of Publication 15.02.2023
Patent
MeV-based ion beam analysis apparatus
Moeller, Soeren, Hiller, Albert Martin, Esser, Gerwin, Kurth, Sina, Linsmeier, Christian, Hoeschen, Daniel, Scholtysik, Christian
Year of Publication 22.02.2022
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Year of Publication 22.02.2022
Patent
MEV-BASED ION BEAM ANALYSIS APPARATUS
MÖLLER, Sören, HÖSCHEN, Daniel, LINSMEIER, Christian, ESSER, Gerwin, KURTH, Sina, HILLER, Albert, Martin, SCHOLTYSIK, Christian
Year of Publication 24.03.2021
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Year of Publication 24.03.2021
Patent
MEV-BASED ION BEAM ANALYSIS APPARATUS
Moeller, Soeren, Hiller, Albert Martin, Esser, Gerwin, Kurth, Sina, Linsmeier, Christian, Hoeschen, Daniel, Scholtysik, Christian
Year of Publication 18.03.2021
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Year of Publication 18.03.2021
Patent
Sistema analítico de haces de iones basado en megaelectronvoltios
MÖLLER, Sören, HÖSCHEN, Daniel, LINSMEIER, Christian, ESSER, Gerwin, KURTH, Sina, HILLER, Albert, SCHOLTYSIK, Christian
Year of Publication 23.05.2023
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Year of Publication 23.05.2023
Patent
MEV-BASED ION BEAM ANALYSIS APPARATUS
MOLLER SOREN, KURTH SINA, HOSCHEN DANIEL, SCHOLTYSIK CHRISTIAN, ESSER GERWIN, HILLER ALBERT M, LINSMEIER CHRISTIAN
Year of Publication 19.01.2021
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Year of Publication 19.01.2021
Patent
MEV-BASED ION BEAM ANALYSIS APPARATUS
MÖLLER, Sören, HÖSCHEN, Daniel, LINSMEIER, Christian, ESSER, Gerwin, KURTH, Sina, HILLER, Albert, SCHOLTYSIK, Christian
Year of Publication 21.11.2019
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Year of Publication 21.11.2019
Patent
MeV-basierte Ionenstrahl-Analytikanlage
Hiller, Albert Martin, Esser, Gerwin, Kurth, Sina, Linsmeier, Christian, Möller, Sören, Höschen, Daniel, Scholtysik, Christian
Year of Publication 21.11.2019
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Year of Publication 21.11.2019
Patent