Characterization of Single Phase Nanometric Cu2O Films Grown by Thermal Oxidation in the Range of 600 to 950° C in an Atmosphere with Low Oxygen Content
Hill-Pastor, Laura, Juarez-Amador, Lucia, Vasquez-Agustin, M., Galvan-Arellano, Miguel, Diaz-Becerril, Tomas, Pena-Sierra, Ramon
Published in 2018 15th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE) (01.09.2018)
Published in 2018 15th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE) (01.09.2018)
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