Stacking Ensemble Approach for Churn Prediction: Integrating CNN and Machine Learning Models with CatBoost Meta-Learner
Tan, Yan Lin, Pang, Ying Han, Ooi, Shih Yin, Khoh, Wee How, Hiew, Fu San
Published in Journal of Engineering Technology and Applied Physics (15.09.2023)
Published in Journal of Engineering Technology and Applied Physics (15.09.2023)
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Journal Article
High-Level Language and Compiler for Reconfigurable Computing
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Book Chapter
Conference Proceeding
Test pin configuration for test device for testing devices under test
Sugianto, Yusman, Swee Lee, Gan, Chyeo Yong, Tay, Tan, Wee Kuan, Hudda, Murad, Hiew, Fu San, Yussuff, Arieff Ridzwan, Tan, Siao Kiat, Xiaojun, Wang, Dandong, Ge, Chow York, Lee
Year of Publication 05.02.2019
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Year of Publication 05.02.2019
Patent
Test Pin Configuration for Test Device for Testing Devices Under Test
TAN Wee Kuan, HIEW Fu San, TAN Siao Kiat, YUSSUFF Arieff Ridzwan, CHYEO YONG Tay, SUGIANTO Yusman, CHOW YORK Lee, SWEE LEE Gan, DANDONG Ge, HUDDA Murad, XIAOJUN Wang
Year of Publication 22.06.2017
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Year of Publication 22.06.2017
Patent
Prüfstiftkonfiguration für eine Prüfvorrichtung zum Prüfen von Prüflingen
Sugianto, Yusman, Gan, Swee Lee, Hudda, Murad, Tan, Wee Kuan, Hiew, Fu San, Yussuff, Arieff Ridzwan, Lee, Chow York, Tan, Siao Kiat, Ge, Dandong, Wang, Xiaojun, Tay, Chyeo Yong
Year of Publication 22.06.2017
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Year of Publication 22.06.2017
Patent