A Comprehensive SPICE Modeling Methodology for Hot-carrier Degradation
Monga, Udit, Gogineni, Usha, Hetzel, Ines, Jin, Chong, Steinmair, Alexander
Published in 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) (03.03.2024)
Published in 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) (03.03.2024)
Get full text
Conference Proceeding