by Lin, S. Y, Fleming, J. G, Hetherington, D. L, Smith, B. K, Biswas, R, Ho, K. M, Sigalas, M. M, Zubrzycki, W, Kurtz, S. R, Bur, Jim
Published in Nature (London) (16.07.1998)

by Stine, B.E., Ouma, D.O., Divecha, R.R., Boning, D.S., Chung, J.E., Hetherington, D.L., Harwoo, C.R., Nakagawa, O.S., Soo-Young Oh
Published in IEEE transactions on semiconductor manufacturing (01.02.1998)

by Hetherington, D.L., Klem, J.F., Weaver, H.T.
Published in IEEE electron device letters (01.09.1992)

by Hetherington, D.L., Klem, J.F., Weaver, H.T.
Published in IEEE electron device letters (01.03.1992)

by STEIN, D. J, HETHERINGTON, D. L, CECCHI, J. L
Published in Journal of the Electrochemical Society (1999)

by Shaneyfelt, M.R., Warren, W.L., Hetherington, D.L., Winokur, P.S., Reber, R.A.
Published in IEEE transactions on nuclear science (01.12.1995)

by Hetherington, D L, Kostuk, R K, Gupta, M C
Published in Applied optics (2004) (20.01.1993)

by STEIN, D. J, HETHERINGTON, D. L, CECCHI, J. L
Published in Journal of the Electrochemical Society (01.05.1999)

by Shaneyfelt, M.R., Warren, W.L., Hetherington, D.L., Timon, R.P., Resnick, P.J., Winokur, P.S.
Published in Microelectronic engineering (01.06.1995)

by Herrera, G.V., Bauer, T., Blain, M.G., Dodd, P.E., Dondero, R., Garcia, E.J., Galambos, P.C., Hetherington, D.L., Hudgens, J.J., McCormick, F.B., Nielson, G.N., Nordquist, C.D., Okandan, M., Olsson, R.H., Platzbecker, M.R., Resnick, P.J., Shul, R.J., Shaw, M.J., Sullivan, C.T., Watts, M.R.
Published in 2008 IEEE International SOI Conference (01.10.2008)

by Stein, David J., Cecchi, Joseph L., Hetherington, Dale L.
Published in Journal of materials research (01.09.1999)

by Sorooshian, Jamshid, Philipossian, Ara, Stein, David J., Timon, Robert P., Hetherington, Dale L.
Published in Japanese Journal of Applied Physics (01.03.2005)