Search Results - "Hess, Carl" :: K.UTB vyhledávací portál | TBU Library Retrieval Portal

Redesigning Research Guides: Lessons Learned from Usability Testing at the University of Memphis

Redesigning Research Guides: Lessons Learned from Usability Testing at the University of Memphis

by McClure, Jessica, Hess, Carl, Marsicano, David
Published in Information technology and libraries (01.09.2023)

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Journal Article

두 개의 포토마스크의 비교에 의한 포토마스크의 검사

두 개의 포토마스크의 비교에 의한 포토마스크의 검사

by XIONG YALIN, SOUSA WESTON L, HESS CARL E
Year of Publication 02.10.2019

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Patent

DELTA DIE AND DELTA DATABASE INSPECTION

DELTA DIE AND DELTA DATABASE INSPECTION

by LIU YANWEI, XIONG YALIN, HESS CARL E
Year of Publication 30.11.2016

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Patent

Randombred Populations of The Southern Regional Poultry Breeding Project1

Randombred Populations of The Southern Regional Poultry Breeding Project1

by Hess, Carl W.
Published in World's poultry science journal (18.09.2007)

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Journal Article

USING REFLECTED AND TRANSMISSION MAPS TO DETECT RETICLE DEGRADATION

USING REFLECTED AND TRANSMISSION MAPS TO DETECT RETICLE DEGRADATION

by SHI RUI FANG, HESS CARL E
Year of Publication 27.11.2014

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Patent

TIME-VARYNG INTENSITY MAP GENERATION FOR RETICLES

TIME-VARYNG INTENSITY MAP GENERATION FOR RETICLES

by HESS CARL, VAVUL THOMAS, SHI RUI FANG
Year of Publication 06.11.2014

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Patent

METHODS FOR INSPECTION OF WAFERS AND RETICLES USING DESIGNER INTENT DATA

METHODS FOR INSPECTION OF WAFERS AND RETICLES USING DESIGNER INTENT DATA

by WATSON STERLING, KEKARE SAGAR A, HESS CARL, CHANG ELLIS, VOLK WILLIAM, MCCAULEY SHARON, PAUL FRANK MARELLA, WILEY JAMES
Year of Publication 11.01.2018

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Patent

DATABASE-DRIVEN CELL-TO-CELL RETICLE INSPECTION

DATABASE-DRIVEN CELL-TO-CELL RETICLE INSPECTION

by HESS CARL, MILLER JOHN D, GUAN CHUN, RUI FANG SHI
Year of Publication 18.03.2014

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Patent

METHOD AND SYSTEM FOR HYBRID RETICLE INSPECTION

METHOD AND SYSTEM FOR HYBRID RETICLE INSPECTION

by HESS CARL, LOPRESTI PATRICK, MILLER JOHN D, XUE SHAN
Year of Publication 10.03.2014

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Patent

METHODS AND SYSTEMS FOR INSPECTION OF WAFERS AND RETICLES USING DESIGNER INTENT DATA

METHODS AND SYSTEMS FOR INSPECTION OF WAFERS AND RETICLES USING DESIGNER INTENT DATA

by WATSON STERLING, KEKARE SAGAR A, HESS CARL, CHANG ELLIS, VOLK WILLIAM, MCCAULEY SHARON, PAUL FRANK MARELLA, WILEY JAMES
Year of Publication 15.09.2016

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Patent

METHODS AND SYSTEMS FOR INSPECTION OF WAFERS AND RETICLES USING DESIGNER INTENT DATA

METHODS AND SYSTEMS FOR INSPECTION OF WAFERS AND RETICLES USING DESIGNER INTENT DATA

by WATSON STERLING, KEKARE SAGAR A, HESS CARL, CHANG ELLIS, VOLK WILLIAM, MCCAULEY SHARON, PAUL FRANK MARELLA, WILEY JAMES
Year of Publication 12.08.2016

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Patent

METHODS AND SYSTEMS FOR INSPECTION OF WAFERS AND RETICLES USING DESIGNER INTENT DATA

METHODS AND SYSTEMS FOR INSPECTION OF WAFERS AND RETICLES USING DESIGNER INTENT DATA

by WATSON STERLING, KEKARE SAGAR A, HESS CARL, CHANG ELLIS, VOLK WILLIAM, MCCAULEY SHARON, PAUL FRANK MARELLA, WILEY JAMES
Year of Publication 16.04.2015

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Patent

USING REFLECTED AND TRANSMISSION MAPS TO DETECT RETICLE DEGRADATION

USING REFLECTED AND TRANSMISSION MAPS TO DETECT RETICLE DEGRADATION

by HESS, Carl, E, SHI, Rui-fang
Year of Publication 04.05.2022

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Patent

Focus offset contamination inspection

Focus offset contamination inspection

by HESS CARL
Year of Publication 19.08.2014

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Patent

Delta die intensity map measurement

Delta die intensity map measurement

by HESS CARL E
Year of Publication 12.07.2016

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Patent

FOCUS OFFSET CONTAMINATION INSPECTION

FOCUS OFFSET CONTAMINATION INSPECTION

by HESS CARL
Year of Publication 12.04.2012

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Patent

DELTA DIE INTENSITY MAP MEASUREMENT

DELTA DIE INTENSITY MAP MEASUREMENT

by HESS, CARL, E
Year of Publication 27.11.2014

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Patent

DELTA DIE INTENSITY MAP MEASUREMENT

DELTA DIE INTENSITY MAP MEASUREMENT

by HESS CARL E
Year of Publication 19.06.2014

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Patent

DELTA DIE INTENSITY MAP MEASUREMENT

DELTA DIE INTENSITY MAP MEASUREMENT

by HESS, CARL, E
Year of Publication 19.06.2014

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Patent

Inspection of photomasks by comparing two photomasks

Inspection of photomasks by comparing two photomasks

by Xiong, Yalin, Hess, Carl E, Sousa, Weston L
Year of Publication 22.10.2019

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Patent

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