An Improved Analytical Model for Carrier Multiplication Near Breakdown in Diodes
Hueting, Raymond J. E., Heringa, Anco, Boksteen, Boni K., Dutta, Satadal, Ferrara, Alessandro, Agarwal, Vishal, Annema, Anne Johan
Published in IEEE transactions on electron devices (01.01.2017)
Published in IEEE transactions on electron devices (01.01.2017)
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Journal Article
Ideal RESURF Geometries
Ferrara, Alessandro, Boksteen, Boni K., Hueting, Raymond J. E., Heringa, Anco, Schmitz, Jurriaan, Steeneken, Peter G.
Published in IEEE transactions on electron devices (01.10.2015)
Published in IEEE transactions on electron devices (01.10.2015)
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Journal Article
A 65 nm CMOS 30 dBm Class-E RF Power Amplifier With 60% PAE and 40% PAE at 16 dB Back-Off
Apostolidou, M., van der Heijden, M.P., Leenaerts, D.M.W., Sonsky, J., Heringa, A., Volokhine, I.
Published in IEEE journal of solid-state circuits (01.05.2009)
Published in IEEE journal of solid-state circuits (01.05.2009)
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Journal Article
Conference Proceeding
Integrated heat sinks for SOI power devices
Liang Yan, Koops, Gerhard, Steeneken, Peter, Heringa, Anco, Surdeanu, Radu, van Dijk, Luc
Published in 2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01.05.2013)
Published in 2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01.05.2013)
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Conference Proceeding
Gate-drain charge analysis for switching in power trench MOSFETs
Hueting, R.J.E., Hijzen, E.A., Heringa, A., Ludikhuize, A.W., Zandt, M.A.Ai
Published in IEEE transactions on electron devices (01.08.2004)
Published in IEEE transactions on electron devices (01.08.2004)
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Journal Article
Solution Methods of Electrical Field Problems in Physiology
Heringa, Anco, Stegeman, Dick F., Uijen, Gerard J. H., De Weerd, J.P.C.
Published in IEEE transactions on biomedical engineering (01.01.1982)
Published in IEEE transactions on biomedical engineering (01.01.1982)
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Journal Article
ESD robust high-voltage active clamps
Notermans, Guido, Quittard, Olivier, Heringa, Anco, Mrčarica, Željko, Blanc, Fabrice, Zwol, Hans van, Smedes, Theo, Keller, Thomas, Jong, Peter de
Published in Microelectronics and reliability (01.12.2009)
Published in Microelectronics and reliability (01.12.2009)
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Journal Article
Scaling of characteristic frequencies in RF CMOS
Boots, H.M.J., Doornbos, G., Heringa, A.
Published in IEEE transactions on electron devices (01.12.2004)
Published in IEEE transactions on electron devices (01.12.2004)
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Journal Article
A new technique for characterizing very low frequency noise of bipolar junction transistors
Tuinhout, H., Zegers-van Duijnhoven, A., Mertens, H., Heringa, A.
Published in 2011 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (01.10.2011)
Published in 2011 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (01.10.2011)
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Conference Proceeding
Low-Leakage Ultra-Scaled Junctions in MOS Devices; from Fundamentals to Improved Device Performance
Duffy, Ray, Heringa, Anco, Loo, Josine, Augendre, Emmanuel, Severi, Simone, Curatola, Gilberto
Published in ECS transactions (20.10.2006)
Published in ECS transactions (20.10.2006)
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Journal Article