by Herfst, R.W., Steeneken, P.G., Huizing, H.G.A., Schmitz, J.
Published in IEEE transactions on semiconductor manufacturing (01.05.2008)

by Herfst, R.W., Klop, W.A., Eschen, M., van den Dool, T.C., Koster, N.B., Sadeghian, H.
Published in Measurement : journal of the International Measurement Confederation (01.10.2014)

by Herfst, R.W., Steeneken, P.G., Schmitz, J.
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)

by Herfst, R.W., Steeneken, P.G., Schmitz, J., Mank, A.J.G., van Gils, M.
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)

by Herfst, R.W., Huizing, H.G.A., Steeneken, P.G., Schmitz, J.
Published in 2006 IEEE International Conference on Microelectronic Test Structures (2006)

by Herfst, R.W., Steeneken, P.G., Schmitz, J.
Published in 2008 IEEE 21st International Conference on Micro Electro Mechanical Systems (01.01.2008)

by Stulemeijer, J., Herfst, R.W., Bielen, J.A.
Published in 2009 IEEE 22nd International Conference on Micro Electro Mechanical Systems (01.01.2009)