Laser collimation of an Fe atomic beam on a leaky transition
SMEETS, B, HERFST, R. W, MAGUIRE, L. P, TE SLIGTE, E, VAN DER STRATEN, P, BEIJERINCK, H. C. W, VAN LEEUWEN, K. A. H
Published in Applied physics. B, Lasers and optics (01.06.2005)
Published in Applied physics. B, Lasers and optics (01.06.2005)
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Journal Article
Fast RF-CV characterization through high-speed 1-port S-parameter measurements
Herfst, R W, Steeneken, P G, Tiggelman, M P J, Stulemeijer, J, Schmitz, J
Published in 2010 International Conference on Microelectronic Test Structures (ICMTS) (01.03.2010)
Published in 2010 International Conference on Microelectronic Test Structures (ICMTS) (01.03.2010)
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Conference Proceeding
Systematic characterization of optical beam deflection measurement system for micro and nanomechanical systems
Herfst, R.W., Klop, W.A., Eschen, M., van den Dool, T.C., Koster, N.B., Sadeghian, H.
Published in Measurement : journal of the International Measurement Confederation (01.10.2014)
Published in Measurement : journal of the International Measurement Confederation (01.10.2014)
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Journal Article
Fast RF-CV Characterization Through High-Speed 1-port S-Parameter Measurements
Herfst, R. W., Steeneken, P. G., Tiggelman, M. P. J., Stulemeijer, J., Schmitz, J.
Published in IEEE transactions on semiconductor manufacturing (01.08.2012)
Published in IEEE transactions on semiconductor manufacturing (01.08.2012)
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Journal Article
Conference Proceeding
Time and voltage dependence of dielectric charging in RF MEMS capacitive switches
Herfst, R.W., Steeneken, P.G., Schmitz, J.
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
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Conference Proceeding
Kelvin probe study of laterally inhomogeneous dielectric charging and charge diffusion in RF MEMS capacitive switches
Herfst, R.W., Steeneken, P.G., Schmitz, J., Mank, A.J.G., van Gils, M.
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)
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Conference Proceeding
Simultaneous extraction of threshold voltage and mobility degradation from on-the-fly NBTI measurements
Herfst, R W, Schmitz, J, Scholten, A J
Published in 2011 International Reliability Physics Symposium (01.04.2011)
Published in 2011 International Reliability Physics Symposium (01.04.2011)
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Conference Proceeding
Nanopositioning MEMS stage for high speed positioning of metamaterials lenses for use in high resolution optical imaging
Herfst, R. W., Bijster, R. J. F., Dekker, A., Wei, J., van Zeijl, H. W., Kruidhof, R., Sadeghian, H.
Published in 2017 IEEE International Conference on Advanced Intelligent Mechatronics (AIM) (01.07.2017)
Published in 2017 IEEE International Conference on Advanced Intelligent Mechatronics (AIM) (01.07.2017)
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Conference Proceeding
Meta-instrument: high speed positioning and tracking platform for near-field optical imaging microscopes
Bijster, R. J. F, Herfst, R. W, Spierdijk, J. P. F, Dekker, A, Klop, W. A, Kramer, G. F. IJ, Cheng, L. K, Hagen, R. A. J, Sadeghian, H
Year of Publication 15.08.2016
Year of Publication 15.08.2016
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Journal Article
Identifying degradation mechanisms in RF MEMS capacitive switches
Herfst, R.W., Steeneken, P.G., Schmitz, J.
Published in 2008 IEEE 21st International Conference on Micro Electro Mechanical Systems (01.01.2008)
Published in 2008 IEEE 21st International Conference on Micro Electro Mechanical Systems (01.01.2008)
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Conference Proceeding
Chaos in Electrostatically Actuated RF-MEMS Measured and Modeled
Stulemeijer, J., Herfst, R.W., Bielen, J.A.
Published in 2009 IEEE 22nd International Conference on Micro Electro Mechanical Systems (01.01.2009)
Published in 2009 IEEE 22nd International Conference on Micro Electro Mechanical Systems (01.01.2009)
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Conference Proceeding