Impact of access resistance on New-Y function methodology for MOSFET parameter extraction in advanced FD-SOI technology
Henry, Jean-Baptiste, Cros, Antoine, Rosa, Julien, Rafhay, Quentin, Ghibaudo, Gerard
Published in 2017 International Conference of Microelectronic Test Structures (ICMTS) (01.03.2017)
Published in 2017 International Conference of Microelectronic Test Structures (ICMTS) (01.03.2017)
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Conference Proceeding
New access resistance extraction methodology for 14nm FD-SOI technology
Henry, Jean-Baptiste, Cros, Antoine, Rosa, Julien, Rafhay, Quentin, Ghibaudo, Gerard
Published in 2016 International Conference on Microelectronic Test Structures (ICMTS) (01.03.2016)
Published in 2016 International Conference on Microelectronic Test Structures (ICMTS) (01.03.2016)
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Conference Proceeding
Journal Article
Ortho-rectification and terrain correction of polarimetric SAR data applied in the ALOS/Palsar context
Rauste, Yrjo, Lonnqvist, Anne, Molinier, Matthieu, Henry, Jean-Baptiste, Hame, Tuomas
Published in 2007 IEEE International Geoscience and Remote Sensing Symposium (01.07.2007)
Published in 2007 IEEE International Geoscience and Remote Sensing Symposium (01.07.2007)
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Conference Proceeding
Interferometric Triherence for Ground Movements Monitoring
Rauste, Y., Louhisuo, M., Henry, J.-B., Kuzuoka, S., Morohoshi, T., Hame, T.
Published in 2006 IEEE International Symposium on Geoscience and Remote Sensing (01.07.2006)
Published in 2006 IEEE International Symposium on Geoscience and Remote Sensing (01.07.2006)
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Conference Proceeding