Scaling trends and bias dependence of the soft error rate of 16 nm and 7 nm FinFET SRAMs
Narasimham, Balaji, Gupta, Saket, Reed, Dan, Wang, J. K., Hendrickson, Nick, Taufique, Hasan
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)
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