by Schön, R., Alfonsi, M., Hemink, G., Decowski, M.P., van Bakel, N., van der Graaf, H.
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (01.08.2013)

by Satoh, S., Hemink, G., Hatakeyama, K., Aritome, S.
Published in IEEE transactions on electron devices (01.02.1998)

by Aritome, S., Shirota, R., Hemink, G., Endoh, T., Masuoka, F.
Published in Proceedings of the IEEE (01.05.1993)

by Tanzawa, T., Tanaka, T., Takeuchi, K., Shirota, R., Aritome, S., Watanabe, H., Hemink, G., Shimizu, K., Sato, S., Takeuchi, Y., Ohuchi, K.
Published in IEEE journal of solid-state circuits (01.05.1997)

by Nitta, H., Kamigaichi, T., Arai, F., Futatsuyama, T., Endo, M., Nishihara, N., Murata, T., Takekida, H., Izumi, T., Uchida, K., Maruyama, T., Kawabata, I., Suyama, Y., Sato, A., Ueno, K., Takeshita, H., Joko, Y., Watanabe, S., Liu, Y., Meguro, H., Kajita, A., Ozawa, Y., Takeuchi, Y., Hara, T., Watanabe, T., Sato, S., Tomiie, H., Kanemaru, Y., Shoji, R., Lai, C.H., Nakamichi, M., Owada, K., Ishigaki, T., Hemink, G., Dutta, D., Dong, Y., Chen, C., Liang, G., Higashitani, M., Lutze, J.
Published in 2009 IEEE International Reliability Physics Symposium (01.01.2009)

by Aritome, S., Takeuchi, Y., Sato, S., Watanabe, I., Shimizu, K., Hemink, G., Shirota, R.
Published in IEEE transactions on electron devices (01.01.1997)

by Hemink, G.J., Meijer, B.W., Kerkhoff, H.G.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.06.1990)

by Watanabe, H, Aritome, S, Hemink, G J, Maruyama, T, Shirota, R
Published in Digest of technical papers - Symposium on VLSI Technology (01.01.1994)

by Wijburg, R.C., Hemink, G.J., Middelhoek, J., Wallinga, H., Mouthaan, T.J.
Published in IEEE transactions on electron devices (01.01.1991)

by Wijburg, R.C., Hemink, G.J., Middelhoek, J.
Published in IEEE transactions on electron devices (01.01.1990)

by Hemink, G.J., Wijburg, R.C.M., Wolbert, P.B.M., Wallinga, H.
Published in ESSDERC '91: 21st European Solid State Device Research Conference (1991)

by Fukuda, K., Watanabe, Y., Makino, E., Kawakami, K., Sato, J., Takagiwa, T., Kanagawa, N., Shiga, H., Tokiwa, N., Shindo, Y., Ogawa, T., Edahiro, T., Iwai, M., Nagao, O., Musha, J., Minamoto, T., Furuta, Y., Yanagidaira, K., Suzuki, Y., Nakamura, D., Hosomura, Y., Tanaka, R., Komai, H., Muramoto, M., Shikata, G., Yuminaka, A., Sakurai, K., Sakai, M., Hong Ding, Watanabe, M., Kato, Y., Miwa, T., Mak, A., Nakamichi, M., Hemink, G., Lee, D., Higashitani, M., Murphy, B., Bo Lei, Matsunaga, Y., Naruke, K., Hara, T.
Published in IEEE journal of solid-state circuits (01.01.2012)

by Alfonsi, M., van Bakel, N., Decowski, M. P., Hemink, G., van der Graaf, H., Schon, R.
Published in 2011 IEEE Nuclear Science Symposium Conference Record (01.10.2011)

by Ichige, M., Takeuchi, Y., Sugimae, K., Sato, A., Matsui, M., Kamigaichi, T., Kutsukake, H., Ishibashi, Y., Saito, M., Mori, S., Meguro, H., Miyazaki, S., Miwa, T., Takahashi, S., Iguchi, T., Kawai, N., Tamon, S., Arai, N., Kamata, H., Minami, T., Iizuka, H., Higashitani, M., Pham, T., Hemink, G., Momodomi, M., Shirota, R.
Published in 2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407) (2003)

by Takeuchi, K, Kameda, Y, Fujimura, S, Otake, H, Hosono, K, Shiga, H, Watanabe, Y, Futatsuyama, T, Shindo, Y, Kojima, M, Iwai, M, Shirakawa, M, Ichige, M, Hatakeyama, K, Tanaka, S, Kamei, T, Fu, J-Y, Cernea, A, Li, Y, Higashitani, M, Hemink, G, Sato, S, Oowada, K, Lee, S-C, Hayashida, N, Wan, J, Lutze, J, Tsao, S, Mofidi, M, Sakurai, K, Tokiwa, N, Waki, H, Nozawa, Y, Kanazawa, K, Ohshima, S
Published in IEEE journal of solid-state circuits (01.01.2007)

by TAKEUCHI, Ken, KAMEDA, Yasushi, IWAI, Makoto, SHIRAKAWA, Masanobu, ICHIGE, Masayuki, HATAKEYAMA, Kazuo, TANAKA, Shinichi, KAMEI, Teruhiko, FU, Jia-Yi, CEMEA, Adi, YAN LI, HIGASHITAM, Masaaki, FUJIMURA, Susumu, HEMINK, Gertjan, SATO, Shinji, OOWADA, Ken, LEE, Shih-Chung, HAYASHIDA, Naoki, JUN WAN, LUTZE, Jeffrey, TSAO, Shouchang, MOFIDI, Mehrdad, SAKURAI, Kiyofumi, OTAKE, Hiroyuki, TOKIWA, Naoya, WAKI, Hiroko, NOZAWA, Yasumitsu, KANAZAWA, Kazuhisa, OHSHIMA, Shigeo, HOSONO, Koji, SHIGA, Hitoshi, WATANABE, Yoshihisa, FUTATSUYAMA, Takuya, SHINDO, Yoshihiko, KOJIMA, Masatsugu
Published in IEEE journal of solid-state circuits (2007)

by Takeuchi, K., Kameda, Y., Fujimura, S., Otake, H., Hosono, K., Shiga, H., Watanabe, Y., Futatsuyama, T., Shindo, Y., Kojima, M., Iwai, M., Shirakawa, M., Ichige, M., Hatakeyama, K., Tanaka, S., Kamei, T., Jia-Yi Fu, Cernea, A., Yan Li, Higashitani, M., Hemink, G., Sato, S., Oowada, K., Shih-Chung Lee, Hayashida, N., Jun Wan, Lutze, J., Shouchang Tsao, Mofidi, M., Sakurai, K., Tokiwa, N., Waki, H., Nozawa, Y., Kanazawa, K., Ohshima, S.
Published in IEEE journal of solid-state circuits (01.01.2007)

by Shibata, N., Kanda, K., Hisada, T., Isobe, K., Sato, M., Shimizu, Y., Shimizu, T., Sugimoto, T., Kobayashi, T., Inuzuka, K., Kanagawa, N., Kajitani, Y., Ogawa, T., Nakai, J., Iwasa, K., Kojima, M., Suzuki, T., Suzuki, Y., Sakai, S., Fujimura, T., Utsunomiya, Y., Hashimoto, T., Miakashi, M., Kobayashi, N., Inagaki, M., Matsumoto, Y., Inoue, S., He, D., Honda, Y., Musha, J., Nakagawa, M., Honma, M., Abiko, N., Koyanagi, M., Yoshihara, M., Ino, K., Noguchi, M., Kamei, T., Kato, Y., Zaitsu, S., Nasu, H., Ariki, T., Chibvongodze, H., Watanabe, M., Ding, H., Ookuma, N., Yamashita, R., Liang, G., Hemink, G., Moogat, F., Trinh, C., Higashitani, M., Pham, T., Kanazawa, K.
Published in 2012 IEEE International Solid-State Circuits Conference (01.02.2012)

by Aritome, S., Takeuchi, Y., Sato, S., Watanabe, H., Shimizu, K., Hemink, G., Shirota, R.
Published in Proceedings of International Electron Devices Meeting (1995)

by Tanzawa, T., Tanaka, T., Takeuchi, K., Shirota, R., Aritome, S., Watanabe, H., Hemink, G., Shimizu, K., Sato, S., Takeuchi, Y., Ohuchi, K.
Published in 1996 Symposium on VLSI Circuits. Digest of Technical Papers (1996)