by Hellman, OC, Vandenbroucke, JA, Rüsing, J, Isheim, D, Seidman, DN
Published in Microscopy and microanalysis (01.09.2000)

by Hellman, Olof C, Seidman, David N
Published in Materials science & engineering. A, Structural materials : properties, microstructure and processing (15.04.2002)

by Hellman, Olof C., Rivage, John Blatz du, Seidman, David N.
Published in Ultramicroscopy (01.05.2003)

by Yoon, Kevin E., Noebe, Ronald D., Hellman, Olof C., Seidman, David N.
Published in Surface and interface analysis (01.05.2004)

by Rüsing, J, Sebastian, JT, Hellman, OC, Seidman, DN
Published in Microscopy and microanalysis (01.09.2000)

by Isheim, Dieter, Hellman, Olof C, Seidman, David N, Danoix, Frédéric, Blavette, Didier
Published in Scripta materialia (17.03.2000)

by Sebastian, J.T, Rüsing, J, Hellman, O.C, Seidman, D.N, Vriesendorp, W, Kooi, B.J, De Hosson, J.Th.M
Published in Ultramicroscopy (01.10.2001)

by Isheim, D, Hellman, O C, Rusing, J, Seidman, D N
Published in Interface science (01.11.2001)

by Hellman, Olof C., Rüsing, Jörg, Sebastian, Jason T., Seidman, David N.
Published in Materials Science & Engineering C (20.08.2001)

by ENG, D. C, HERBOTS, N, HELLMAN, O. C, VANCAUWENBERGHE, O, MOTAKEF, S, CULBERTSON, R. J
Published in Journal of electronic materials (01.11.1989)