Comprehensive Modeling and Characterization of Photon Detection Efficiency and Jitter Tail in Advanced SPAD Devices
Helleboid, Remi, Rideau, Denis, Grebot, Jeremy, Nicholson, Isobel, Moussy, Norbert, Saxod, Olivier, Basset, Marie, Zimmer, Antonin, Mamdy, Bastien, Golanski, Dominique, Agnew, Megan, Pellegrini, Sara, Sicre, Mathieu, Buj, Christel, Marchand, Guillaume, Saint-Martin, Jerome, Pala, Marco, Dollfus, Philippe
Published in IEEE journal of the Electron Devices Society (2022)
Published in IEEE journal of the Electron Devices Society (2022)
Get full text
Journal Article
A Fokker–Planck-based Monte Carlo method for electronic transport and avalanche simulation in single-photon avalanche diodes
Helleboid, Rémi, Rideau, Denis, Nicholson, Isobel, Grebot, Jeremy, Mamdy, Bastien, Mugny, Gabriel, Basset, Marie, Agnew, Megan, Golanski, Dominique, Pellegrini, Sara, Saint-Martin, Jérôme, Pala, Marco, Dollfus, Philippe
Published in Journal of physics. D, Applied physics (15.12.2022)
Published in Journal of physics. D, Applied physics (15.12.2022)
Get full text
Journal Article
Modeling of SPAD avalanche breakdown probability and jitter tail with field lines
Helleboid, Rémi, Rideau, Denis, Grebot, Jeremy, Nicholson, Isobel, Moussy, Norbert, Saxod, Olivier, Saint-Martin, Jérôme, Pala, Marco, Dollfus, Philippe
Published in Solid-state electronics (01.08.2022)
Published in Solid-state electronics (01.08.2022)
Get full text
Journal Article
Full-Band Monte Carlo Study of Hot Carriers for Advection-Diffusion Monte Carlo Simulations
Helleboid, Remi, Saint-Martin, Jerome, Pala, Marco, Dollfus, Philippe, Mugny, Gabriel, Nicholson, Isobel, Rideau, Denis
Published in 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (27.09.2023)
Published in 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (27.09.2023)
Get full text
Conference Proceeding
Bayesian Optimization of Light Grating for High Performance Single-Photon Avalanche Diodes
Grebot, Jeremy, Helleboid, Remi, Mugny, Gabriel, Nicholson, Isobel, Mouron, Louis-Henri Fernandez, Lanteri, Stephane, Rideau, Denis
Published in 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (27.09.2023)
Published in 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (27.09.2023)
Get full text
Conference Proceeding
On the convergence of the recurrence solution of McIntyre's local and non-local avalanche triggering probability equations for SPAD compact models
Saint-Pierre, Dorian, Clerc, Raphael, Helleboid, Remi, Rideau, Denis
Published in ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC) (19.09.2022)
Published in ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC) (19.09.2022)
Get full text
Conference Proceeding
Semi-Empirical model for optical properties of \text\text alloys accounting for strain and temperature
Grebot, Jeremy, Mugny, Gabriel, Helleboid, Remi, Nicholson, Isobel, Abbate, Francesco, Rideau, Denis, Wehbe-Alause, Helene, Scheid, Claire, Lanteri, Stephane
Published in ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC) (13.09.2021)
Published in ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC) (13.09.2021)
Get full text
Conference Proceeding
Dark Count Rate in Single-Photon Avalanche Diodes: Characterization and Modeling study
Sicre, Mathieu, Agnew, Megan, Buj, Christel, Coignus, Jean, Golanski, Dominique, Helleboid, Remi, Mamdy, Bastien, Nicholson, Isobel, Pellegrini, Sara, Rideau, Denis, Roy, David, Calmon, Francis
Published in ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC) (13.09.2021)
Published in ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC) (13.09.2021)
Get full text
Conference Proceeding
Comprehensive modeling and characterization of Photon Detection Efficiency and Jitter in advanced SPAD devices
Helleboid, Remi, Rideau, Denis, Nicholson, Isobel, Moussy, Norbert, Saxod, Olivier, Basset, Marie, Grebot, Jeremy, Zimmerman, Antonin, Mamdy, Bastien, Golanski, Dominique, Agnew, Megan, Pellegrini, Sara, Sicre, Mathieu
Published in ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC) (13.09.2021)
Published in ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC) (13.09.2021)
Get full text
Conference Proceeding
Dark Count Rate in Single-Photon Avalanche Diodes: Characterization and Modeling study
Sicre, Mathieu, Agnew, Megan, Buj, Christel, Coignus, Jean, Golanski, Dominique, Helleboid, Remi, Mamdy, Bastien, Nicholson, Isobel, Pellegrini, Sara, Rideau, Denis, Roy, David, Calmon, Francis
Published in ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference (ESSCIRC) (13.09.2021)
Published in ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference (ESSCIRC) (13.09.2021)
Get full text
Conference Proceeding
Statistical measurements and Monte-Carlo simulations of DCR in SPADs
Sicre, Mathieu, Agnew, Megan, Buj, Christel, Coutier, Caroline, Golanski, Dominique, Helleboid, Remi, Mamdy, Bastien, Nicholson, Isobel, Pellegrini, Sara, Rideau, Denis, Roy, David, Calmon, Francis
Published in ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC) (19.09.2022)
Published in ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC) (19.09.2022)
Get full text
Conference Proceeding