Photonic Side-Channel Analysis of Arbiter PUFs
Tajik, Shahin, Dietz, Enrico, Frohmann, Sven, Dittrich, Helmar, Nedospasov, Dmitry, Helfmeier, Clemens, Seifert, Jean-Pierre, Boit, Christian, Hübers, Heinz-Wilhelm
Published in Journal of cryptology (01.04.2017)
Published in Journal of cryptology (01.04.2017)
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Journal Article
Focused ion beam contact to non-volatile memory cells
Helfmeier, Clemens, Schlangen, Rudolf, Boit, Christian
Published in Microelectronics and reliability (01.09.2014)
Published in Microelectronics and reliability (01.09.2014)
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Journal Article
Conference Proceeding
Ultra sensitive measurement of dielectric current under pulsed stress conditions
Helfmeier, Clemens, Beyreuther, Anne, Fox, Alexander, Boit, Christian
Published in Microelectronics and reliability (01.11.2015)
Published in Microelectronics and reliability (01.11.2015)
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Journal Article
Cloning Physically Unclonable Functions
Helfmeier, Clemens, Boit, Christian, Nedospasov, Dmitry, Seifert, Jean-Pierre
Published in 2013 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST) (01.06.2013)
Published in 2013 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST) (01.06.2013)
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Conference Proceeding
Physical vulnerabilities of Physically Unclonable Functions
Helfmeier, Clemens, Boit, Christian, Nedospasov, Dmitry, Tajik, Shahin, Seifert, Jean-Pierre
Published in 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2014)
Published in 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2014)
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Conference Proceeding
Invasive PUF Analysis
Nedospasov, Dmitry, Seifert, Jean-Pierre, Helfmeier, Clemens, Boit, Christian
Published in 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography (01.08.2013)
Published in 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography (01.08.2013)
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Conference Proceeding
Security Risks Posed by Modern IC Debug and Diagnosis Tools
Boit, Christian, Helfmeier, Clemens, Kerst, Uwe
Published in 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography (01.08.2013)
Published in 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography (01.08.2013)
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Conference Proceeding
Emission Analysis of Hardware Implementations
Tajik, Shahin, Nedospasov, Dmitry, Helfmeier, Clemens, Seifert, Jean-Pierre, Boit, Christian
Published in 2014 17th Euromicro Conference on Digital System Design (01.08.2014)
Published in 2014 17th Euromicro Conference on Digital System Design (01.08.2014)
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Conference Proceeding
Ultra high precision circuit diagnosis through seebeck generation and charge monitoring
Boit, Christian, Helfmeier, Clemens, Nedospasov, Dmitry, Fox, Alexander
Published in Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2013)
Published in Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2013)
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Conference Proceeding
On charge sensors for FIB attack detection
Helfmeier, Clemens, Boit, C., Kerst, U.
Published in 2012 IEEE International Symposium on Hardware-Oriented Security and Trust (01.06.2012)
Published in 2012 IEEE International Symposium on Hardware-Oriented Security and Trust (01.06.2012)
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Conference Proceeding
Backside failure analysis techniques: What's the gain of silicon getting thinner?
Boit, Christian, Schafer, Norbert, Abou-Ras, Daniel, Helfmeier, Clemens, Glowacki, Arkadiusz, Kerst, Uwe
Published in Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.06.2014)
Published in Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.06.2014)
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Conference Proceeding