MAPS sensor for radiation imaging designed in 180 nm SOI CMOS technology
Havranek, M., Benka, T., Hejtmanek, M., Janoska, Z., Kafka, V., Kopecek, J., Kuklova, M., Marcisovska, M., Marcisovsky, M., Neue, G., Svihra, P., Tomasek, L., Vancura, P., Vrba, V.
Published in Journal of instrumentation (18.06.2018)
Published in Journal of instrumentation (18.06.2018)
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Runaway electron diagnostics using silicon strip detector
Novotny, L., Cerovsky, J., Dhyani, P., Ficker, O., Havranek, M., Hejtmanek, M., Janoska, Z., Kafka, V., Kulkov, S., Marcisovska, M., Marcisovsky, M., Neue, G., Svihra, P., Svoboda, V., Tomasek, L., Tunkl, M., Vrba, V.
Published in Journal of instrumentation (01.07.2020)
Published in Journal of instrumentation (01.07.2020)
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Flexible DAQ card for detector systems utilizing the CoaXPress communication standard
Neue, G., Hejtmánek, M., Marčišovský, M., Voleš, P.
Published in Journal of instrumentation (15.04.2015)
Published in Journal of instrumentation (15.04.2015)
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Time of flight measurements with the PH32 chip
Janoska, Z., Benka, T., Havranek, M., Hejtmanek, M., Jakovenko, J., Kafka, V., Kaschner, M., Marcisovska, M., Marcisovsky, M., Neue, G., Tomasek, L., Svihra, P., Vancura, P., Vrba, V.
Published in Journal of instrumentation (12.04.2019)
Published in Journal of instrumentation (12.04.2019)
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Characterization of pixel sensor designed in 180 nm SOI CMOS technology
Benka, T., Havranek, M., Hejtmanek, M., Jakovenko, J., Janoska, Z., Marcisovska, M., Marcisovsky, M., Neue, G., Tomasek, L., Vrba, V.
Published in Journal of instrumentation (01.01.2018)
Published in Journal of instrumentation (01.01.2018)
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A comparative study of the TID radiation effects on ASICs manufactured in 180 nm commercial technologies
Marcisovska, M., Benka, T., Havranek, M., Hejtmanek, M., Janoska, Z., Kafka, V., Marcisovsky, M., Neue, G., Popule, J., Svihra, P., Tomasek, L., Vancura, P., Vrba, V.
Published in Journal of instrumentation (05.12.2018)
Published in Journal of instrumentation (05.12.2018)
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474: ASRA Working Group on Local Anesthetictoxicity
Di Gregorio, G., Bernards, C.M., Butterworth, J.F., Drasner, K., Hejtmanek, M., Mulroy, M.F., Neal, J.M., Rosenquist, R.W., Weinberg, G.
Published in Regional anesthesia and pain medicine (01.09.2008)
Published in Regional anesthesia and pain medicine (01.09.2008)
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PantherPix hybrid pixel γ-ray detector for radio-therapeutic applications
Neue, G., Benka, T., Havránek, M., Hejtmánek, M., Janoška, Z., Kafka, V., Korchak, O., Lednický, D., Marčišovská, M., Marčišovský, M., Popule, J., Şmarhák, J., Şvihra, P., Tomášek, L., Vrba, V., Konček, O., Semmler, M.
Published in Journal of instrumentation (22.02.2018)
Published in Journal of instrumentation (22.02.2018)
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Radiation hardness evaluation of the commercial 150 nm CMOS process using 60 Co source
Carna, M, Havranek, M, Hejtmanek, M, Janoska, Z, Marcisovsky, M, Neue, G, Tomasek, L, Vrba, V
Published in Journal of instrumentation (09.06.2014)
Published in Journal of instrumentation (09.06.2014)
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Journal Article
Radiation hardness evaluation of the commercial 150 nm CMOS process using super(60)Co source
Carna, M, Havranek, M, Hejtmanek, M, Janoska, Z, Marcisovsky, M, Neue, G, Tomasek, L, Vrba, V
Published in Journal of instrumentation (01.06.2014)
Published in Journal of instrumentation (01.06.2014)
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