Transient effects on high voltage diode stack under reverse bias
Papež, V., Kojecký, B., Kožı́šek, J., Hejhal, J.
Published in Microelectronics and reliability (01.04.2003)
Published in Microelectronics and reliability (01.04.2003)
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Journal Article
X'rays findings in case of rejection crisis of transplanted kidney (author's transl)
Metys, R, Jirka, J, Matousovic, K, Rossmann, P, Hejhal, J
Published in Ceskoslovenska radiologie (01.03.1975)
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Published in Ceskoslovenska radiologie (01.03.1975)
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