Quantitative Characterization of Nanometer-Scale Electric Fields via Momentum-Resolved STEM
Beyer, Andreas, Munde, Manveer Singh, Firoozabadi, Saleh, Heimes, Damien, Grieb, Tim, Rosenauer, Andreas, Müller-Caspary, Knut, Volz, Kerstin
Published in Nano letters (10.03.2021)
Published in Nano letters (10.03.2021)
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Journal Article
Influence of plasmon excitations on atomic-resolution quantitative 4D scanning transmission electron microscopy
Beyer, Andreas, Krause, Florian F., Robert, Hoel L., Firoozabadi, Saleh, Grieb, Tim, Kükelhan, Pirmin, Heimes, Damien, Schowalter, Marco, Müller-Caspary, Knut, Rosenauer, Andreas, Volz, Kerstin
Published in Scientific reports (21.10.2020)
Published in Scientific reports (21.10.2020)
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Journal Article
Impact of Beam Size and Diffraction Effects in the Measurement of Long-Range Electric Fields in Crystalline Samples via 4DSTEM
Heimes, Damien, Chejarla, Varun Shankar, Ahmed, Shamail, Hüppe, Franziska, Beyer, Andreas, Volz, Kerstin
Published in Ultramicroscopy (01.11.2023)
Published in Ultramicroscopy (01.11.2023)
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Journal Article
In-situ biasing and temperature influence on the electric fields across GaAs based p-n junction via 4D STEM
Pokle, Anuj, Heimes, Damien, Beyer, Andreas, Volz, Kerstin
Published in Microscopy and microanalysis (01.08.2021)
Published in Microscopy and microanalysis (01.08.2021)
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Journal Article
Visualizing Structural Transitions and Electric Potentials via 4DSTEM
Pokle, Anuj, Beyer, Andreas, Ahmed, Shamail, Munde, Manveer Singh, Heimes, Damien, Bianchini, Matteo, Hartmann, Pascal, Brezesinski, Torsten, Janek, Jürgen, Volz, Kerstin
Published in Microscopy and microanalysis (01.08.2022)
Published in Microscopy and microanalysis (01.08.2022)
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Journal Article
Quantitative Simulation of Four-dimensional STEM Datasets
Beyer, Andreas, Firoozabadi, Saleh, Heimes, Damien, Kükelhan, Pirmin, Grieb, Tim, Krause, Florian, Schowalter, Marco, Robert, Hoel Laurent, Müller-Caspary, Knut, Rosenauer, Andreas, Volz, Kerstin
Published in Microscopy and microanalysis (01.08.2020)
Published in Microscopy and microanalysis (01.08.2020)
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Journal Article