by Liefrink, F, Dierikx, E F, Heimeriks, J W, Eklund, G, Flouda, I, Funck, T, Helistö, P, Jakab, A, Janssen, J-T, Jeanneret, B, Jensen, H D, Hetland, P O, Lindic, M, Lo-Hive, J-P, Nicolas, J, Nunes, M, Power, O, Alonso, F I Raso, Reymann, D, Selçik, S, Streit, J, Vrabcek, P, Waldmann, W
Published in Metrologia (01.01.2003)

by Liefrink, F., Houtzager, E., de Jong, G., Teunissen, P., Heimeriks, J.W., Dyrseth, A.A., Royset, A., Johnsen, L., Behr, R., Kohlmann, J., Schulze, H., Vollmer, E., Niemeyer, J.
Published in Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031) (2000)