GIDL Increase Due to HCI Stress: Correlation Study of MOSFET Degradation Parameters and Modelling for Reliability Simulation
Ceccarelli, Edoardo, Manning, Kevin, Maxwell, Seamus, Heffernan, Colm
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
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Conference Proceeding
마모 모니터 디바이스
HEFFERNAN COLM PATRICK, BRADLEY SHAUN, BOLAND DAVID, COYNE EAWARD JOHN, FORDE MARK, CLARKE DAVID J, LOOBY MICHAEL, MANNING KEVIN B, O'DONNELL ALAN J, AHERNE DAVID, O'DWYER THOMAS G
Year of Publication 18.06.2019
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Year of Publication 18.06.2019
Patent
HCD-Induced GIDL Increase and Circuit Implications
Ceccarelli, Edoardo, Manning, Kevin, Macera, Giuseppe, Dempsey, Dennis, Heffernan, Colm
Published in 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS) (01.07.2019)
Published in 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS) (01.07.2019)
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Conference Proceeding
Semiconductor device configured for gate dielectric monitoring
Heffernan, Colm Patrick, Meskell, John P, Forde, Mark, Geary, Shane, Coyne, Edward John
Year of Publication 09.07.2024
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Year of Publication 09.07.2024
Patent
80V HVDMOS reliability characterization for 0.6μm and 0.35μm technologies
Heffernan, C., Forde, M.
Published in 2007 IEEE International Integrated Reliability Workshop Final Report (01.10.2007)
Published in 2007 IEEE International Integrated Reliability Workshop Final Report (01.10.2007)
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Conference Proceeding
Stress Evolution in Electrodeposited Copper Metallization during Room-Temperature Aging
Chowdhury, Tamjid, Ahmed, Shafaat, Buckley, D. N., Laugier, Michael, Nakahara, Shohei, Heffernan, Colm
Published in ECS transactions (07.07.2006)
Published in ECS transactions (07.07.2006)
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Journal Article
Exposure monitor device
Manning, Kevin B, Heffernan, Colm Patrick, Bradley, Shaun, Clarke, David J, O'Dwyer, Thomas G, Forde, Mark, Coyne, Edward John, Looby, Michael A, Boland, David, Aherne, David, O'Donnell, Alan J
Year of Publication 21.05.2024
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Year of Publication 21.05.2024
Patent
SEMICONDUCTOR DEVICE CONFIGURED FOR GATE DIELECTRIC MONITORING
Heffernan, Colm Patrick, Meskell, John P, Forde, Mark, Geary, Shane, Coyne, Edward John
Year of Publication 11.03.2021
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Year of Publication 11.03.2021
Patent
EXPOSURE MONITOR DEVICE
Manning, Kevin B, Heffernan, Colm Patrick, Bradley, Shaun, Clarke, David J, O'Dwyer, Thomas G, Forde, Mark, Coyne, Edward John, Looby, Michael A, Boland, David, Aherne, David, O'Donnell, Alan J
Year of Publication 16.11.2023
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Year of Publication 16.11.2023
Patent
Exposure monitor device
Manning, Kevin B, Heffernan, Colm Patrick, Bradley, Shaun, Clarke, David J, O'Dwyer, Thomas G, Forde, Mark, Coyne, Edward John, Looby, Michael A, Boland, David, Aherne, David, O'Donnell, Alan J
Year of Publication 27.06.2023
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Year of Publication 27.06.2023
Patent
WEAR-OUT MONITOR DEVICE
HEFFERNAN, Colm, Patrick, FORDE, Mark, BRADLEY, Shaun, BOLAND, David, MANNING, Kevin, B, COYNE, Edward, John, AHERNE, David, LOOBY, Michael, O'DONNELL, Alan, J, CLARKE, David, J, O'DWYER, Thomas, G
Year of Publication 08.06.2022
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Year of Publication 08.06.2022
Patent
EXPOSURE MONITOR DEVICE
Manning, Kevin B, Heffernan, Colm Patrick, Bradley, Shaun, Clarke, David J, O'Dwyer, Thomas G, Forde, Mark, Coyne, Edward John, Looby, Michael A, Boland, David, Aherne, David, O'Donnell, Alan J
Year of Publication 11.08.2022
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Year of Publication 11.08.2022
Patent
Exposure monitor device
Manning, Kevin B, Heffernan, Colm Patrick, Bradley, Shaun, Clarke, David J, O'Dwyer, Thomas G, Forde, Mark, Coyne, Edward John, Looby, Michael A, Boland, David, Aherne, David, O'Donnell, Alan J
Year of Publication 08.03.2022
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Year of Publication 08.03.2022
Patent
WEAR-OUT MONITOR DEVICE
Manning, Kevin B, Heffernan, Colm Patrick, Bradley, Shaun, Clarke, David J, O'Dwyer, Thomas G, Forde, Mark, Coyne, Edward John, Looby, Michael A, Boland, David, Aherne, David, O'Donnell, Alan J
Year of Publication 25.03.2021
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Year of Publication 25.03.2021
Patent
WEAR-OUT MONITOR DEVICE
HEFFERNAN, Colm, Patrick, FORDE, Mark, BRADLEY, Shaun, BOLAND, David, MANNING, Kevin, B, AHERNE, David, LOOBY, Michael, O'DONNELL, Alan, J, CLARKE, David, J, O'DWYER, Thomas, G, COYNE, Eaward, John
Year of Publication 15.01.2020
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Year of Publication 15.01.2020
Patent
Wear-out monitor device
Manning, Kevin B, Heffernan, Colm Patrick, Bradley, Shaun, Clarke, David J, O'Dwyer, Thomas G, Forde, Mark, Coyne, Edward John, Looby, Michael A, Boland, David, Aherne, David, O'Donnell, Alan J
Year of Publication 06.10.2020
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Year of Publication 06.10.2020
Patent
Wear-out monitor device
Manning, Kevin B, Heffernan, Colm Patrick, Clarke, David J, Forde, Mark, O'Dwyer, Thomas G, Coyne, Edward John, Looby, Michael A, Aherne, David, O'Donnell, Alan J
Year of Publication 02.07.2019
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Year of Publication 02.07.2019
Patent
SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE CONFIGURED WITH GATE DIELECTRIC MONITORING CAPABILITY, AND METHOD OF MONITORING GATE DIELECTRIC OF METAL-OXIDE-SEMICONDUCTOR TRANSISTOR
COYNE, EDWARD JOHN, HEFFERNAN, COLM PATRICK, GEARY, SHANE, MESKELL, JOHN P, FORDE, MARK
Year of Publication 21.05.2022
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Year of Publication 21.05.2022
Patent