The CoveRT Approach for Coverage Management in Analog and Mixed-Signal Integrated Circuits
Sanyal, Sayandeep, Dasgupta, Pallab, Hazra, Aritra, Das, Sourav, Morrison, Scott, Surendran, Sudhakar, Balasubramanian, Lakshmanan
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.12.2022)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.12.2022)
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Journal Article
Usage-Driven Personalization of Power Management Logic
Mandal, Sudipa, Hazra, Aritra, Dasgupta, Pallab
Published in IEEE embedded systems letters (01.09.2021)
Published in IEEE embedded systems letters (01.09.2021)
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Journal Article
Physically Related Functions: Exploiting Related Inputs of PUFs for Authenticated-Key Exchange
Chatterjee, Durba, Boyapally, Harishma, Patranabis, Sikhar, Chatterjee, Urbi, Hazra, Aritra, Mukhopadhyay, Debdeep
Published in IEEE transactions on information forensics and security (2022)
Published in IEEE transactions on information forensics and security (2022)
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Journal Article
PURSE: Property Ordering Using Runtime Statistics for Efficient Multi - Property Verification
Das, Sourav, Hazra, Aritra, Dasgupta, Pallab, Kundu, Sudipta, Jain, Himanshu
Published in 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE) (25.03.2024)
Published in 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE) (25.03.2024)
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Conference Proceeding
An RL based Approach for Thermal-Aware Energy Optimized Task Scheduling in Multi-core Processors
Mandal, Sudipa, Gaurkar, Krushna, Dasgupta, Pallab, Hazra, Aritra
Published in 2021 34th International Conference on VLSI Design and 2021 20th International Conference on Embedded Systems (VLSID) (01.02.2021)
Published in 2021 34th International Conference on VLSI Design and 2021 20th International Conference on Embedded Systems (VLSID) (01.02.2021)
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Conference Proceeding
Formal assessment of reliability specifications in embedded cyber-physical systems
Hazra, Aritra, Dasgupta, Pallab, Chakrabarti, Partha Pratim
Published in Journal of applied logic (01.11.2016)
Published in Journal of applied logic (01.11.2016)
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Journal Article
XFC: A framework for eXploitable Fault Characterization in block ciphers
Khanna, Punit, Rebeiro, Chester, Hazra, Aritra
Published in 2017 54th ACM/EDAC/IEEE Design Automation Conference (DAC) (01.06.2017)
Published in 2017 54th ACM/EDAC/IEEE Design Automation Conference (DAC) (01.06.2017)
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Conference Proceeding
Tracking Coverage Artefacts for Periodic Signals using Sequence-based Abstractions
Chakraborty, Ayan, Sanyal, Sayandeep, Dasgupta, Pallab, Hazra, Aritra, Morrison, Scott, Surendran, Sudhakar, Balasubramanian, Lakshmanan
Published in 2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID) (01.02.2022)
Published in 2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID) (01.02.2022)
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Conference Proceeding
SMT-Based Verification of Safety-Critical Embedded Control Software
Adhikary, Sunandan, Gurung, Amit, Thakkar, Jay, Costa, Antonio Bruto Da, Dey, Soumyajit, Hazra, Aritra, Dasgupta, Pallab
Published in IEEE embedded systems letters (01.09.2021)
Published in IEEE embedded systems letters (01.09.2021)
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Journal Article
CoveRT: A Coverage Reporting Tool for Analog Mixed-Signal Designs
Sanyal, Sayandeep, Hazra, Aritra, Dasgupta, Pallab, Morrison, Scott, Surendran, Sudhakar, Balasubramanian, Lakshmanan
Published in 2020 33rd International Conference on VLSI Design and 2020 19th International Conference on Embedded Systems (VLSID) (01.01.2020)
Published in 2020 33rd International Conference on VLSI Design and 2020 19th International Conference on Embedded Systems (VLSID) (01.01.2020)
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Conference Proceeding
SOLOMON: An Automated Framework for Detecting Fault Attack Vulnerabilities in Hardware
Srivastava, Milind, SLPSK, Patanjali, Roy, Indrani, Rebeiro, Chester, Hazra, Aritra, Bhunia, Swarup
Published in 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2020)
Published in 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2020)
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Conference Proceeding